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Transmission Electron Microscopy and Diffractometry of Materials: With numerous exercises - Fultz, Brent, Howe, James
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Fultz, Brent, Howe, James:

Transmission Electron Microscopy and Diffractometry of Materials: With numerous exercises - edition reliée, livre de poche

2007, ISBN: 9783540738855

Springer, Gebundene Ausgabe, Auflage: 3rd Corrected ed. 2008, Corr. 2nd printing 2009, 778 Seiten, Publiziert: 2007-10-11T00:00:01Z, Produktgruppe: Buch, 6.13 kg, Maschinenbau, Ingenieurw… Plus…

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Fultz, Brent; Howe, James:

Transmission Electron Microscopy and Diffractometry of Materials - edition reliée, livre de poche

2009, ISBN: 3540738851

[EAN: 9783540738855], Neubuch, [PU: Springer], 100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out in one business day wi… Plus…

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Transmission Electron Microscopy and Diffractometry of Materials [Hardcover] Fultz, Brent and Howe, James - edition reliée, livre de poche

2007

ISBN: 9783540738855

Hardcover, 3rd ed. 2008-Rechnung mit MwSt-Versand aus Deutschland., Very good in very good dust jacket., [PU: Springer]

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Transmission Electron Microscopy and Diffractometry of Materials - livre d'occasion

ISBN: 9783540738855

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Brent Fultz:
Transmission Electron Microscopy and Diffractometry of Materials - edition reliée, livre de poche

2007, ISBN: 3540738851

[EAN: 9783540738855], Neubuch, [PU: Springer], new, Books

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Transmission Electron Microscopy and Diffractometry of Materials: With numerous exercises

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The third edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM. This edition is not substantially longer than the second, but all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. The book explains the fundamentals of how waves and wave functions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. TOC:Diffraction and the X-Ray Powder Diffractometer.- The TEM and Its Optics.- Scattering.- Inelastic Electron Scattering and Spectroscopy.- Diffraction from Crystals.- Electron Diffraction and Crystallography.- Diffraction Contrast in TEM Images.- Diffraction Lineshapes.- Patterson Functions and Diffuse Scattering.- High-Resolution TEM Imaging.- High-Resolution STEM Imaging.- Dynamical Theory.

Informations détaillées sur le livre - Transmission Electron Microscopy and Diffractometry of Materials: With numerous exercises


EAN (ISBN-13): 9783540738855
ISBN (ISBN-10): 3540738851
Version reliée
Livre de poche
Date de parution: 2007
Editeur: Springer
758 Pages
Poids: 1,287 kg
Langue: eng/Englisch

Livre dans la base de données depuis 2007-09-11T06:35:40+02:00 (Paris)
Page de détail modifiée en dernier sur 2023-06-26T18:33:44+02:00 (Paris)
ISBN/EAN: 3540738851

ISBN - Autres types d'écriture:
3-540-73885-1, 978-3-540-73885-5
Autres types d'écriture et termes associés:
Auteur du livre: brent, james howe, fultz
Titre du livre: new level, third text, the new high, appendix appendix, high resolution electron microscopy, all need, have and, cover cover, materials and methods, how, characterization materials, too, transmission electron microscopy and diffractometry materials hardcover oct 2007 fultz brent and howe james, exercises, remarkable, principles, laboratory, this that, stem, meet, ray microscopy


Données de l'éditeur

Auteur: Brent Fultz; James Howe
Titre: Transmission Electron Microscopy and Diffractometry of Materials
Editeur: Springer; Springer Berlin
758 Pages
Date de parution: 2009-10-15
Berlin; Heidelberg; DE
Poids: 2,780 kg
Langue: Anglais
96,25 € (DE)
98,95 € (AT)
129,13 CHF (CH)
Not available, publisher indicates OP

BB; Book; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; PES; diffraction; spectroscopy; transmission electron microscopy; electron diffraction; Crystallography; STEM; microscopy; electron microscopy; crystal; REM; Chemistry and Materials Science; B; Characterization and Evaluation of Materials; Surfaces and Interfaces, Thin Films; Crystallography and Scattering Methods; Solid State Physics; Spectroscopy and Microscopy; Engineering, general; Materialwissenschaft; Oberflächenchemie und Adsorption; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Spektroskopie, Spektrochemie, Massenspektrometrie; Spektroskopie, Spektrochemie, Massenspektrometrie; Wissenschaftliche Ausstattung, Experimente und Techniken; Ingenieurswesen, Maschinenbau allgemein; BB; EA; BB

Diffraction and the X-Ray Powder Diffractometer.- The TEM and its Optics.- Scattering.- Inelastic Electron Scattering and Spectroscopy.- Diffraction from Crystals.- Electron Diffraction and Crystallography.- Diffraction Contrast in TEM Images.- Diffraction Lineshapes.- Patterson Functions and Diffuse Scattering.- High-Resolution TEM Imaging.- High-Resolution STEM Imaging.- Dynamical Theory.

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