ISBN: 9783642072116
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial a… Plus…
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ISBN: 9783642072116
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial a… Plus…
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Applied Scanning Probe Methods V - Livres de poche
2010, ISBN: 9783642072116
[ED: Softcover], [PU: Springer / Springer Berlin Heidelberg / Springer, Berlin], The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applie… Plus…
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Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques - Livres de poche
2010, ISBN: 3642072119
Edition reliée
Softcover reprint of hardcover 1st ed. 2007 Kartoniert / Broschiert Spektroskopie, Spektrochemie, Massenspektrometrie, Nanotechnologie, Materialwissenschaft, Technische Anwendung von Po… Plus…
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Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques - Livres de poche
2010, ISBN: 3642072119
Edition reliée
Softcover reprint of hardcover 1st ed. 2007 Kartoniert / Broschiert Spektroskopie, Spektrochemie, Massenspektrometrie, Nanotechnologie, Materialwissenschaft, Technische Anwendung von Po… Plus…
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Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques - nouveau livre
ISBN: 9783642072116
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial a… Plus…
ISBN: 9783642072116
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial a… Plus…
Applied Scanning Probe Methods V - Livres de poche
2010
ISBN: 9783642072116
[ED: Softcover], [PU: Springer / Springer Berlin Heidelberg / Springer, Berlin], The volumes V, VI and VII will examine the physical and technical foundation for recent progress in applie… Plus…
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques - Livres de poche
2010, ISBN: 3642072119
Edition reliée
Softcover reprint of hardcover 1st ed. 2007 Kartoniert / Broschiert Spektroskopie, Spektrochemie, Massenspektrometrie, Nanotechnologie, Materialwissenschaft, Technische Anwendung von Po… Plus…
Applied Scanning Probe Methods V Scanning Probe Microscopy Techniques - Livres de poche
2010, ISBN: 3642072119
Edition reliée
Softcover reprint of hardcover 1st ed. 2007 Kartoniert / Broschiert Spektroskopie, Spektrochemie, Massenspektrometrie, Nanotechnologie, Materialwissenschaft, Technische Anwendung von Po… Plus…
Données bibliographiques du meilleur livre correspondant
Informations détaillées sur le livre - Applied Scanning Probe Methods V: Scanning Probe Microscopy Techniques
EAN (ISBN-13): 9783642072116
ISBN (ISBN-10): 3642072119
Version reliée
Livre de poche
Date de parution: 2010
Editeur: Springer Berlin
392 Pages
Poids: 0,591 kg
Langue: eng/Englisch
Livre dans la base de données depuis 2011-04-27T16:47:34+02:00 (Paris)
Page de détail modifiée en dernier sur 2024-01-14T12:42:10+01:00 (Paris)
ISBN/EAN: 3642072119
ISBN - Autres types d'écriture:
3-642-07211-9, 978-3-642-07211-6
Autres types d'écriture et termes associés:
Auteur du livre: bhushan, harald fuchs, satoshi
Titre du livre: scanning probe microscopy nanoscience, applied methods, probe aufnahmen
Données de l'éditeur
Auteur: Bharat Bhushan; Harald Fuchs; Satoshi Kawata
Titre: NanoScience and Technology; Applied Scanning Probe Methods V - Scanning Probe Microscopy Techniques
Editeur: Springer; Springer Berlin
344 Pages
Date de parution: 2010-11-25
Berlin; Heidelberg; DE
Imprimé / Fabriqué en
Langue: Anglais
117,69 € (DE)
120,99 € (AT)
130,00 CHF (CH)
POD
XLV, 344 p.
BC; Hardcover, Softcover / Technik/Allgemeines, Lexika; Elektronik; Verstehen; AFM; PES; REM; Raman spectroscopy; ceramics; elasticity; liquid; microscopy; modeling; polymer; spectroscopy; Microsystems and MEMS; Spectroscopy; Surface and Interface and Thin Film; Nanotechnology; Surfaces, Interfaces and Thin Film; Polymers; Spektroskopie, Spektrochemie, Massenspektrometrie; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Nanotechnologie; Materialwissenschaft; Technische Anwendung von Polymeren und Verbundwerkstoffen; BB; EA
Integrated Cantilevers and Atomic Force Microscopes.- Electrostatic Microscanner.- Low-Noise Methods for Optical Measurements of Cantilever Deflections.- Q-controlled Dynamic Force Microscopy in Air and Liquids.- High-Frequency Dynamic Force Microscopy.- Torsional Resonance Microscopy and Its Applications.- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy.- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale.- New AFM Developments to Study Elasticity and Adhesion at the Nanoscale.- Near-Field Raman Spectroscopy and Imaging.First book summarizing the state-of-the-art of this technique Real industrial applications included Includes supplementary material: sn.pub/extras
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