Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science): 305 - Livres de poche
2014, ISBN: 1461359457
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2014, ISBN: 1461359457
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Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science): 305 - Livres de poche
2014, ISBN: 1461359457
[EAN: 9781461359456], Neubuch, [PU: Springer-Verlag New York Inc., United States, New York, NY], SORIN CRISTOLOVEANU ELECTRICAL CHARACTERIZATION OF SILICON ON INSULATOR MATERIALS AND DEVI… Plus…
Sorin Cristoloveanu, Sheng Li:
Electrical Characterization of Silicon-on-Insulator Materials and Devices (Paperback) - Livres de poche2014, ISBN: 1461359457
[EAN: 9781461359456], Neubuch, [PU: Springer-Verlag New York Inc., United States], Language: English. Brand new Book. Silicon on Insulator is more than a technology, more than a job, and … Plus…
2014
ISBN: 1461359457
[EAN: 9781461359456], Neubuch, [PU: Springer US], DIODE; ELECTRONICS; MATERIAL; MICROELECTRONICS; TRANSISTOR; WAFER, Druck auf Anfrage Neuware - Silicon on Insulator is more than a techno… Plus…
2014, ISBN: 1461359457
[EAN: 9781461359456], Neubuch, [SC: 0.0], [PU: Springer US], TRANSISTOR; WAFER; DIODE; ELECTRONICS; MATERIAL; MICROELECTRONICS, Druck auf Anfrage Neuware -Silicon on Insulator is more tha… Plus…
2014, ISBN: 9781461359456
Buch, Softcover, Softcover reprint of the original 1st ed. 1995, [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2014
Données bibliographiques du meilleur livre correspondant
Informations détaillées sur le livre - Electrical Characterization of Silicon-on-Insulator Materials and Devices
EAN (ISBN-13): 9781461359456
ISBN (ISBN-10): 1461359457
Version reliée
Livre de poche
Date de parution: 2014
Editeur: Springer-Verlag New York Inc.
Livre dans la base de données depuis 2014-10-09T22:47:04+02:00 (Paris)
Page de détail modifiée en dernier sur 2022-08-14T15:00:30+02:00 (Paris)
ISBN/EAN: 1461359457
ISBN - Autres types d'écriture:
1-4613-5945-7, 978-1-4613-5945-6
Autres types d'écriture et termes associés:
Auteur du livre: sheng
Titre du livre: devices wonder, electrical engineering material, characterization materials
Données de l'éditeur
Auteur: Sorin Cristoloveanu; Sheng Li
Titre: The Springer International Series in Engineering and Computer Science; Electrical Characterization of Silicon-on-Insulator Materials and Devices
Editeur: Springer; Springer US
381 Pages
Date de parution: 2014-02-23
New York; NY; US
Imprimé / Fabriqué en
Poids: 0,611 kg
Langue: Anglais
213,99 € (DE)
219,99 € (AT)
236,00 CHF (CH)
POD
XV, 381 p.
BC; Electrical Engineering; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Elektrotechnik; Verstehen; Diode; electronics; material; microelectronics; transistor; Wafer; Optical and Electronic Materials; Electrical and Electronic Engineering; Optical Materials; Technische Anwendung von elektronischen, magnetischen, optischen Materialien; BB
1. Introduction. 2. Methods of Forming SOI Wafers. 3. SOI Devices. 4. Wafer Screening Techniques. 5. Transport Measurements. 6. SUS Capacitor Based Characterization Techniques. 7. Diode Measurements. 8. Transistor Characteristics. 9. Transistor Based Characterization Techniques. 10. Monitoring the Transistor Degradation. Index.Autres livres qui pourraient ressembler au livre recherché:
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