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Inside NAND Flash Memories | Rino Micheloni (u. a.) | Buch | HC gerader Rücken kaschiert | X | Englisch | 2010 | Springer Netherland | EAN 9789048194308 - edition reliée, livre de poche
2010, ISBN: 9789048194308
[ED: Gebunden], [PU: Springer Netherland], Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memo… Plus…
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2010, ISBN: 904819430X
[EAN: 9789048194308], Neubuch, [SC: 0.0], [PU: Springer Netherlands], BAUELEMENT (ELEKTRONISCH) - BAUSTEIN (ELEKTRONISCH); ELEKTRONIK / BAUELEMENTE; CHEMIE; EXPERIMENT; VERSUCH; FESTKÖRPE… Plus…
Crippa, Luca;Marelli, Alessia;Micheloni, Rino:
Inside NAND Flash Memories - edition reliée, livre de poche2010, ISBN: 9789048194308
[ED: Hardcover], [PU: Springer / Springer Netherlands], Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media.To realize how much NAN… Plus…
ISBN: 9789048194308
Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just… Plus…
ISBN: 9789048194308
Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memories pervade every aspect of our life, just… Plus…
Inside NAND Flash Memories | Rino Micheloni (u. a.) | Buch | HC gerader Rücken kaschiert | X | Englisch | 2010 | Springer Netherland | EAN 9789048194308 - edition reliée, livre de poche
2010, ISBN: 9789048194308
[ED: Gebunden], [PU: Springer Netherland], Digital photography, MP3, digital video, etc. make extensive use of NAND-based Flash cards as storage media. To realize how much NAND Flash memo… Plus…
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Informations détaillées sur le livre - Inside NAND Flash Memories Rino Micheloni Author
EAN (ISBN-13): 9789048194308
ISBN (ISBN-10): 904819430X
Version reliée
Livre de poche
Date de parution: 2010
Editeur: Springer Netherlands Core >2 >T
582 Pages
Poids: 1,024 kg
Langue: eng/Englisch
Livre dans la base de données depuis 2007-09-15T14:16:07+02:00 (Paris)
Page de détail modifiée en dernier sur 2024-03-16T15:04:06+01:00 (Paris)
ISBN/EAN: 904819430X
ISBN - Autres types d'écriture:
90-481-9430-X, 978-90-481-9430-8
Autres types d'écriture et termes associés:
Auteur du livre: luca crippa, marelli
Titre du livre: inside outside, look inside, flash art, memories 1978 1985
Données de l'éditeur
Auteur: Rino Micheloni; Luca Crippa; Alessia Marelli
Titre: Inside NAND Flash Memories
Editeur: Springer; Springer Netherland
582 Pages
Date de parution: 2010-08-18
Dordrecht; NL
Imprimé / Fabriqué en
Langue: Anglais
246,09 € (DE)
252,99 € (AT)
271,50 CHF (CH)
POD
X, 582 p.
BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Devices; Flash Memories; NAND Memories; Solid State Circuits; integrated circuit; single-electron transistor; static-induction transistor; Electronic Circuits and Systems; Mass Spectrometry; Condensed Matter Physics; Spectroscopy; Spektroskopie, Spektrochemie, Massenspektrometrie; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); BC
Preface. Acknowledgements. 1 Market and applications for NAND flash memories; Gregory Wong. 2 NAND overview: from memory to systems; R. Micheloni, A. Marelli and S. Commodaro. 3 Program and erase of NAND memory arrays; Cristoph Friederich. 4 Reliability issues of NAND flash memories; C. Zambelli, A. Chimenton and P. Olivo. 5 Charge trap NAND technologies ; Alessandro Grossi. 6 Control logic; A. Marelli, R. Micheloni and R. Ravasio. 7 NAND DDR interface; Andrea Silvagni. 8 Sensing circuits; L. Crippa and R. Micheloni. 9 Parasitic effects and verify circuits; L. Crippa and R. Micheloni. 10 MLC storage; L. Crippa and R. Micheloni. 11 Charge pumps, voltage regulators and HV switches; R. Micheloni and L. Crippa. 12 High voltage overview; R. Micheloni and A. Marelli. 13 Redundancy; A. Marelli and R. Micheloni . 14 Error correction codes; T. Zhang, A. Marelli and R. Micheloni. 15 NAND design for testability and testing; Andrea Silvagni. 16 XLC storage; R. Micheloni and L. Crippa. 17 Flash cards; A. Ghilardelli and S. Corno. 18 Low power 3D-integrated SSD; K. Takeuchi. 19 Radiation effects on NAND Flash memories; M. Bagatin, G. Cellere, S. Gerardin and A. Paccagnella. About the authors. Index.Flash NAND design NAND – SSD co-development Radiation effects on Flash memories Charge trap technology overview Includes supplementary material: sn.pub/extras
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