Transmission Electron Microscopy and Diffractometry of Materials: With numerous exercises - edition reliée, livre de poche
2007, ISBN: 9783540738855
Springer, Gebundene Ausgabe, Auflage: 3rd Corrected ed. 2008, Corr. 2nd printing 2009, 778 Seiten, Publiziert: 2007-10-11T00:00:01Z, Produktgruppe: Buch, 6.13 kg, Maschinenbau, Ingenieurw… Plus…
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Transmission Electron Microscopy and Diffractometry of Materials [Hardcover] Fultz, Brent and Howe, James - edition reliée, livre de poche
2007, ISBN: 9783540738855
Hardcover, 3rd ed. 2008-Rechnung mit MwSt-Versand aus Deutschland., Very good in very good dust jacket., [PU: Springer]
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2007, ISBN: 3540738851
[EAN: 9783540738855], Neubuch, [PU: Springer], new, Books
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Transmission Electron Microscopy and Diffractometry of Materials: With numerous exercises - edition reliée, livre de poche
2007, ISBN: 9783540738855
Springer, Gebundene Ausgabe, Auflage: 3rd Corrected ed. 2008, Corr. 2nd printing 2009, 778 Seiten, Publiziert: 2007-10-11T00:00:01Z, Produktgruppe: Buch, 6.13 kg, Maschinenbau, Ingenieurw… Plus…
Fultz, Brent; Howe, James:
Transmission Electron Microscopy and Diffractometry of Materials - edition reliée, livre de poche2009, ISBN: 3540738851
[EAN: 9783540738855], Neubuch, [PU: Springer], 100% BRAND NEW US HARDCOVER STUDENT 3rd Edition / shrink wrapped / Mint condition / ISBN-10: 3540738851 / Shipped out in one business day wi… Plus…
ISBN: 9783540738855
Springer. Used - Very Good. Item in very good condition! Textbooks may not include supplemental items i.e. CDs, access codes etc..., Springer, 3
2007, ISBN: 3540738851
[EAN: 9783540738855], Neubuch, [PU: Springer], new, Books
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Informations détaillées sur le livre - Transmission Electron Microscopy and Diffractometry of Materials: With numerous exercises
EAN (ISBN-13): 9783540738855
ISBN (ISBN-10): 3540738851
Version reliée
Livre de poche
Date de parution: 2007
Editeur: Springer
758 Pages
Poids: 1,287 kg
Langue: eng/Englisch
Livre dans la base de données depuis 2007-09-11T06:35:40+02:00 (Paris)
Page de détail modifiée en dernier sur 2023-06-26T18:33:44+02:00 (Paris)
ISBN/EAN: 9783540738855
ISBN - Autres types d'écriture:
3-540-73885-1, 978-3-540-73885-5
Autres types d'écriture et termes associés:
Auteur du livre: brent, james howe, fultz
Titre du livre: new level, third text, the new high, appendix appendix, high resolution electron microscopy, all need, have and, cover cover, materials and methods, how, characterization materials, too, transmission electron microscopy and diffractometry materials hardcover oct 2007 fultz brent and howe james, exercises, remarkable, principles, laboratory, this that, stem, meet, ray microscopy
Données de l'éditeur
Auteur: Brent Fultz; James Howe
Titre: Transmission Electron Microscopy and Diffractometry of Materials
Editeur: Springer; Springer Berlin
758 Pages
Date de parution: 2009-10-15
Berlin; Heidelberg; DE
Poids: 2,780 kg
Langue: Anglais
96,25 € (DE)
98,95 € (AT)
129,13 CHF (CH)
Not available, publisher indicates OP
BB; Book; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; PES; diffraction; spectroscopy; transmission electron microscopy; electron diffraction; Crystallography; STEM; microscopy; electron microscopy; crystal; REM; Chemistry and Materials Science; B; Characterization and Evaluation of Materials; Surfaces and Interfaces, Thin Films; Crystallography and Scattering Methods; Solid State Physics; Spectroscopy and Microscopy; Engineering, general; Materialwissenschaft; Oberflächenchemie und Adsorption; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Spektroskopie, Spektrochemie, Massenspektrometrie; Spektroskopie, Spektrochemie, Massenspektrometrie; Wissenschaftliche Ausstattung, Experimente und Techniken; Ingenieurswesen, Maschinenbau allgemein; BB; EA; BB
Diffraction and the X-Ray Powder Diffractometer.- The TEM and its Optics.- Scattering.- Inelastic Electron Scattering and Spectroscopy.- Diffraction from Crystals.- Electron Diffraction and Crystallography.- Diffraction Contrast in TEM Images.- Diffraction Lineshapes.- Patterson Functions and Diffuse Scattering.- High-Resolution TEM Imaging.- High-Resolution STEM Imaging.- Dynamical Theory.Autres livres qui pourraient ressembler au livre recherché:
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