Transmission Electron Microscopy and Diffractometry of Materials | James Howe (u. a.) | Taschenbuch | Graduate Texts in Physics | Paperback | XX | Englisch | 2014 | Springer Berlin | EAN 9783642433153 - Livres de poche
2014, ISBN: 9783642433153
[ED: Taschenbuch], [PU: Springer Berlin], This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization … Plus…
booklooker.de |
Transmission Electron Microscopy and Diffractometry of Materials / James Howe (u. a.) / Taschenbuch / Graduate Texts in Physics / Paperback / XX / Englisch / 2014 / Springer Berlin / EAN 9783642433153 - Livres de poche
2014, ISBN: 9783642433153
[ED: Taschenbuch], [PU: Springer Berlin], This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization … Plus…
booklooker.de |
Transmission Electron Microscopy and Diffractometry of Materials / James Howe (u. a.) / Taschenbuch / Graduate Texts in Physics / Paperback / xx / Englisch / 2014 / Springer Berlin / EAN 9783642433153 - Livres de poche
2014, ISBN: 9783642433153
[ED: Taschenbuch], [PU: Springer Berlin], This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization … Plus…
booklooker.de |
Transmission Electron Microscopy and Diffractometry of Materials | James Howe (u. a.) | Taschenbuch | Graduate Texts in Physics | Paperback | xx | Englisch | 2014 | Springer Berlin | EAN 9783642433153 - Livres de poche
2014, ISBN: 9783642433153
[ED: Taschenbuch], [PU: Springer Berlin], This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization … Plus…
booklooker.de |
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) - Livres de poche
2012, ISBN: 9783642433153
Springer, 2012. Paperback. New. 4th edition. 784 pages. 9.25x6.10x1.65 inches., Springer, 2012, 6
Biblio.co.uk |
Transmission Electron Microscopy and Diffractometry of Materials | James Howe (u. a.) | Taschenbuch | Graduate Texts in Physics | Paperback | XX | Englisch | 2014 | Springer Berlin | EAN 9783642433153 - Livres de poche
2014, ISBN: 9783642433153
[ED: Taschenbuch], [PU: Springer Berlin], This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization … Plus…
Howe, James:
Transmission Electron Microscopy and Diffractometry of Materials / James Howe (u. a.) / Taschenbuch / Graduate Texts in Physics / Paperback / XX / Englisch / 2014 / Springer Berlin / EAN 9783642433153 - Livres de poche2014, ISBN: 9783642433153
[ED: Taschenbuch], [PU: Springer Berlin], This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization … Plus…
Transmission Electron Microscopy and Diffractometry of Materials / James Howe (u. a.) / Taschenbuch / Graduate Texts in Physics / Paperback / xx / Englisch / 2014 / Springer Berlin / EAN 9783642433153 - Livres de poche
2014
ISBN: 9783642433153
[ED: Taschenbuch], [PU: Springer Berlin], This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization … Plus…
Transmission Electron Microscopy and Diffractometry of Materials | James Howe (u. a.) | Taschenbuch | Graduate Texts in Physics | Paperback | xx | Englisch | 2014 | Springer Berlin | EAN 9783642433153 - Livres de poche
2014, ISBN: 9783642433153
[ED: Taschenbuch], [PU: Springer Berlin], This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization … Plus…
Données bibliographiques du meilleur livre correspondant
Informations détaillées sur le livre - Transmission Electron Microscopy and Diffractometry of Materials
EAN (ISBN-13): 9783642433153
ISBN (ISBN-10): 3642433154
Version reliée
Livre de poche
Date de parution: 2014
Editeur: Springer Berlin Heidelberg
Livre dans la base de données depuis 2014-12-03T11:31:28+01:00 (Paris)
Page de détail modifiée en dernier sur 2024-03-27T00:48:36+01:00 (Paris)
ISBN/EAN: 9783642433153
ISBN - Autres types d'écriture:
3-642-43315-4, 978-3-642-43315-3
Autres types d'écriture et termes associés:
Auteur du livre: howe james, brent, fultz
Titre du livre: electron microscopy materials, texts and transmission, text and transmission, graduate texts physics
Autres livres qui pourraient ressembler au livre recherché:
Dernier livre similaire:
9783540437642 Transmission Electron Microscopy and Diffractometry of Materials (Advanced Texts in Physics) (Fultz, Brent, Howe, James)
- 9783540437642 Transmission Electron Microscopy and Diffractometry of Materials (Advanced Texts in Physics) (Fultz, Brent, Howe, James)
- 9783540738855 Transmission Electron Microscopy and Diffractometry of Materials: With numerous exercises (Fultz, Brent, Howe, James)
- 9783540678410 Transmission Electron Microscopy and Diffractometry of Materials (Advanced Texts in Physics) (Fultz, Brent, Howe, James M.)
- Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics) by Brent Fultz James Howe(2012-10-14) (Brent Fultz;James M. Howe)
< pour archiver...