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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - A User-Oriented Guide - Hofmann, Siegfried
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Hofmann, Siegfried:
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - A User-Oriented Guide - nouveau livre

2012, ISBN: 3642273815

ID: 9783642273810

In englischer Sprache. Verlag: Springer Berlin, PC-PDF, 528 Seiten, XIX Seiten, 528 Seiten, 1., 2013, [GR: 9645 - Nonbooks, PBS / Physik, Astronomie/Atomphysik, Kernphysik], [SW: - Auger electron spectroscopy], [DRM: To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.  ], [Ausgabe: 1], [PU: Springer, Berlin/Heidelberg/New York, NY]

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - A User-Oriented Guide - Hofmann, Siegfried
Livre non disponible
(*)
Hofmann, Siegfried:
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - A User-Oriented Guide - nouveau livre

2012, ISBN: 3642273815

ID: 9783642273810

In englischer Sprache. Verlag: Springer Berlin, This book presents the basics of Auger- and X-Ray Photoelectron Spectroscopy in Materials Science in logical order from sample preparation and instrument setup through data acquisition to data evaluation. Offers guidance on problem-solving and worked examples. PC-PDF, 528 Seiten, XX Seiten, 528 Seiten, [GR: 9645 - Nonbooks, PBS / Physik, Astronomie/Atomphysik, Kernphysik], [SW: - Physik ], [DRM: NL], [Ausgabe: 2013][PU:Springer Berlin], [PU: Springer, Berlin/Heidelberg/New York, NY]

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - Siegfried Hofmann
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Siegfried Hofmann:
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - Première édition

2013, ISBN: 9783642273810

ID: 26778964

A User-Oriented Guide, [ED: 1], Auflage, eBook Download (PDF), eBooks, [PU: Springer-Verlag]

Nouveaux livres Lehmanns.de
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - Siegfried Hofmann
Livre non disponible
(*)
Siegfried Hofmann:
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - nouveau livre

2013, ISBN: 9783642273810

ID: 26778964

A User-Oriented Guide, [ED: 2013], eBook Download (PDF), eBooks, [PU: Springer Berlin]

Nouveaux livres Lehmanns.de
Frais d'envoiDownload sofort lieferbar, , Versandkostenfrei innerhalb der BRD (EUR 0.00)
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(*) Livre non disponible signifie que le livre est actuellement pas disponible à l'une des plates-formes associées nous recherche.
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - Siegfried Hofmann
Livre non disponible
(*)
Siegfried Hofmann:
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - Première édition

2013, ISBN: 9783642273810

ID: 26778964

A User-Oriented Guide, [ED: 1], 1., 2013, eBook Download (PDF), eBooks, [PU: Springer Berlin]

Nouveaux livres Lehmanns.de
Frais d'envoiDownload sofort lieferbar, , versandkostenfrei in der BRD (EUR 0.00)
Details...
(*) Livre non disponible signifie que le livre est actuellement pas disponible à l'une des plates-formes associées nous recherche.