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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - Siegfried Hofmann
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Siegfried Hofmann:
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - nouveau livre

2012, ISBN: 9783642273803

ID: 685095188

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented. This book presents the basics of Auger- and X-Ray Photoelectron Spectroscopy in Materials Science in logical order from sample preparation and instrument setup through data acquisition to data evaluation. Offers guidance on problem-solving and worked examples. Bücher > Fremdsprachige Bücher > Englische Bücher gebundene Ausgabe 25.10.2012 Buch (fremdspr.), Springer, .201

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - Siegfried Hofmann
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Siegfried Hofmann:
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - nouveau livre

ISBN: 9783642273803

ID: 669315665

To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented. This book presents the basics of Auger- and X-Ray Photoelectron Spectroscopy in Materials Science in logical order from sample preparation and instrument setup through data acquisition to data evaluation. Offers guidance on problem-solving and worked examples. Buch (fremdspr.) Bücher>Fremdsprachige Bücher>Englische Bücher, Springer

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - Siegfried Hofmann
Livre non disponible
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Siegfried Hofmann:
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - nouveau livre

ISBN: 9783642273803

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented., [SC: 0.00], Neuware, gewerbliches Angebot, FixedPrice, [GW: 939g]

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences) - Siegfried Hofmann
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Siegfried Hofmann:
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences) - edition reliée, livre de poche

ISBN: 3642273807

[SR: 1451668], Gebundene Ausgabe, [EAN: 9783642273803], Springer, Springer, Book, [PU: Springer], Springer, 60556011, Materialwissenschaft, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56398011, Festkörperphysik, 56375011, Physik, 56047011, Wissenschaft, 54071011, Genres, 52044011, Fremdsprachige Bücher, 1320310031, Statik, 56375011, Physik, 56047011, Wissenschaft, 54071011, Genres, 52044011, Fremdsprachige Bücher

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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences) - Siegfried Hofmann
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Siegfried Hofmann:
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences) - edition reliée, livre de poche

ISBN: 3642273807

[SR: 1451668], Gebundene Ausgabe, [EAN: 9783642273803], Springer, Springer, Book, [PU: Springer], Springer, 60556011, Materialwissenschaft, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56398011, Festkörperphysik, 56375011, Physik, 56047011, Wissenschaft, 54071011, Genres, 52044011, Fremdsprachige Bücher, 1320310031, Statik, 56375011, Physik, 56047011, Wissenschaft, 54071011, Genres, 52044011, Fremdsprachige Bücher

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Détails sur le livre
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science
Auteur:

Siegfried Hofmann

Titre:

Auger- and X-Ray Photoelectron Spectroscopy in Materials Science

ISBN:

Informations détaillées sur le livre - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science


EAN (ISBN-13): 9783642273803
ISBN (ISBN-10): 3642273807
Version reliée
Date de parution: 2012
Editeur: Springer-Verlag GmbH
528 Pages
Poids: 0,939 kg
Langue: Englisch

Livre dans la base de données depuis 19.06.2007 21:28:18
Livre trouvé récemment le 17.03.2017 20:03:03
ISBN/EAN: 9783642273803

ISBN - Autres types d'écriture:
3-642-27380-7, 978-3-642-27380-3


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