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Applied Scanning Probe Methods XI - Herausgegeben von Bhushan, Bharat Fuchs, Harald
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Herausgegeben von Bhushan, Bharat Fuchs, Harald:
Applied Scanning Probe Methods XI - Livres de poche

2010, ISBN: 9783642098697

[ED: Softcover], [PU: Springer, Berlin], The ability to accurately and reproducibly measure the properties and perf- mance characteristics of nanoscale materials, devices, and systems is a critical enabler for progress in fundamental nanoscience, in the design of new nanoma- rials, and ultimately in manufacturing new nanoscale products [1]. This quotation from the US National Nanotechnology Initiative emphasizes the need for measu- ment tools in emerging nanomaterial applications, a eld predicted to generate a multibillion-dollar market within 10 years. One speci c measurement need is for nanomechanical information knowledge on the nanoscale of mechanical prop- ties such as elastic modulus, adhesion, and friction. Accurate information is essential not only to predict the performance of a system before use, but also to evaluate its reliability during or after use. The measurement need is motivated partly by the fact that new applications often involve structures with nanoscale dimensions (e. g. , nanoelectromechanical systems, nanoimprint lithography). Measurements of such structures by necessity must provide nanoscale spatial resolution. Other new structures have larger overall dimensions, but integrate disparate materials on the micro- or nanoscale (e. g. , electronic interconnect, nanocomposites). In such cases, nanoscale information is needed in order to differentiate the properties of the various components. Many methods to measure small-scale mechanical properties have been devised, including ones based on indentation [2 4], on ultrasonics [5,6], and on other phy- cal phenomena [7,8]. Such methods often have drawbacks: they are not suf ciently quantitative, are limited to specialized geometries, and so forth. 2010. lvi, 236 S. 91 SW-Abb., 22 Farbabb., 17 Tabellen. 235 mm Versandfertig in 3-5 Tagen, DE, [SC: 0.00], Neuware, gewerbliches Angebot, offene Rechnung (Vorkasse vorbehalten)

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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology) - Bharat Bhushan, Harald Fuchs
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Bharat Bhushan, Harald Fuchs:
Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology) - Livres de poche

2010, ISBN: 364209869X

Taschenbuch, [EAN: 9783642098697], Springer, Springer, Book, [PU: Springer], 2010-11-16, Springer, 60449011, Chemie für Ingenieure, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 60556011, Materialwissenschaft, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56049011, Analytische Chemie, 56048011, Chemie, 56047011, Fachbücher, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56062011, Physisch & Theoretisch, 56048011, Chemie, 56047011, Fachbücher, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56398011, Festkörperphysik, 56375011, Physik, 56047011, Fachbücher, 54071011, Genres, 52044011, Fremdsprachige Bücher, 1320310031, Statik, 56375011, Physik, 56047011, Fachbücher, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56444011, Nanotechnologie, 56441011, Technologie, 56047011, Fachbücher, 54071011, Genres, 52044011, Fremdsprachige Bücher

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Applied Scanning Probe Methods XI - Bharat Bhushan; Harald Fuchs
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Bharat Bhushan; Harald Fuchs:
Applied Scanning Probe Methods XI - Livres de poche

ISBN: 9783642098697

ID: 9783642098697

Engineering; Nanotechnology and Microengineering; Spectroscopy and Microscopy; Surface and Interface Science, Thin Films; Nanotechnology; Surfaces and Interfaces, Thin Films; Polymer Sciences AFM, REM, ceramics, microscopy, polymer, spectroscopy, ultrasound Books Book (Paperback Initiative), Springer Science+Business Media

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The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. These volumes constitute a timely comprehensive overview of SPM applications. Real industrial applications are included. Frais d'envoi EUR 0.00
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Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology) - Bharat Bhushan (Editor), Harald Fuchs (Editor)
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Bharat Bhushan (Editor), Harald Fuchs (Editor):
Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology) - Livres de poche

2010, ISBN: 9783642098697

Edition reliée, ID: 599426157

Springer, 2010-11-19. Softcover reprint of hardcover 1. Paperback. Used:Good. Buy with confidence. Excellent Customer Service & Return policy. Ships Fast. Expedite Shipping Available., Springer, 2010-11-19

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Applied Scanning Probe Methods XI - Bharat Bhushan; Harald Fuchs
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Bharat Bhushan; Harald Fuchs:
Applied Scanning Probe Methods XI - Livres de poche

2010, ISBN: 9783642098697

Edition reliée, ID: 17261546

Scanning Probe Microscopy Techniques, Softcover reprint of hardcover 1st ed. 2009, Softcover, Buch, [PU: Springer Berlin]

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Détails sur le livre
Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (Nanoscience and Technology)

The volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techniques. The first volume came out in January 2004, the second to fourth volumes in early 2006 and the fifth to seventh volumes in late 2006. The field is progressing so fast that there is a need for a set of volumes every 12 to 18 months to capture latest developments. These volumes constitute a timely comprehensive overview of SPM applications. After introducing scanning probe microscopy, including sensor technology and tip characterization, chapters on use in various industrial applications are presented. Industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters have been written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.

Informations détaillées sur le livre - Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (Nanoscience and Technology)


EAN (ISBN-13): 9783642098697
ISBN (ISBN-10): 364209869X
Version reliée
Livre de poche
Date de parution: 2010
Editeur: Springer-Verlag GmbH
292 Pages
Poids: 0,445 kg
Langue: eng/Englisch

Livre dans la base de données depuis 27.04.2011 16:47:34
Livre trouvé récemment le 26.09.2017 07:23:19
ISBN/EAN: 9783642098697

ISBN - Autres types d'écriture:
3-642-09869-X, 978-3-642-09869-7


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