ISBN: 9783540373162
The scanning probe microscopy ?eld has been rapidly expanding.It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial ap… Plus…
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ISBN: 9783540373162
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial a… Plus…
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ISBN: 9783540373162
; PDF; Scientific, Technical and Medical > Science: general issues > Scientific equipment, experiments & te, Springer Berlin Heidelberg
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ISBN: 9783540373162
Applied Scanning Probe Methods V - Scanning Probe Microscopy Techniques: ab 106.99 € eBooks > Sachthemen & Ratgeber > Technik Springer-Verlag GmbH eBook als pdf, Springer-Verlag GmbH
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2006, ISBN: 9783540373162
Scanning Probe Microscopy Techniques, eBooks, eBook Download (PDF), 2007, [PU: Springer Berlin], Springer Berlin, 2006
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ISBN: 9783540373162
The scanning probe microscopy ?eld has been rapidly expanding.It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial ap… Plus…
ISBN: 9783540373162
The scanning probe microscopy ?eld has been rapidly expanding. It is a demanding task to collect a timely overview of this ?eld with an emphasis on technical dev- opments and industrial a… Plus…
ISBN: 9783540373162
; PDF; Scientific, Technical and Medical > Science: general issues > Scientific equipment, experiments & te, Springer Berlin Heidelberg
ISBN: 9783540373162
Applied Scanning Probe Methods V - Scanning Probe Microscopy Techniques: ab 106.99 € eBooks > Sachthemen & Ratgeber > Technik Springer-Verlag GmbH eBook als pdf, Springer-Verlag GmbH
2006, ISBN: 9783540373162
Scanning Probe Microscopy Techniques, eBooks, eBook Download (PDF), 2007, [PU: Springer Berlin], Springer Berlin, 2006
Données bibliographiques du meilleur livre correspondant
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Informations détaillées sur le livre - Applied Scanning Probe Methods V
EAN (ISBN-13): 9783540373162
ISBN (ISBN-10): 3540373160
Date de parution: 2006
Editeur: Springer Berlin
344 Pages
Langue: eng/Englisch
Livre dans la base de données depuis 2007-01-08T12:58:01+01:00 (Paris)
Page de détail modifiée en dernier sur 2024-01-14T12:42:07+01:00 (Paris)
ISBN/EAN: 9783540373162
ISBN - Autres types d'écriture:
3-540-37316-0, 978-3-540-37316-2
Autres types d'écriture et termes associés:
Auteur du livre: harald fuchs, bhushan, michael klein
Titre du livre: applied scanning probe methods
Données de l'éditeur
Auteur: Bharat Bhushan; Harald Fuchs; Satoshi Kawata
Titre: NanoScience and Technology; Applied Scanning Probe Methods V - Scanning Probe Microscopy Techniques
Editeur: Springer; Springer Berlin
344 Pages
Date de parution: 2006-11-04
Berlin; Heidelberg; DE
Imprimé / Fabriqué en
Langue: Anglais
106,99 € (DE)
110,00 € (AT)
130,00 CHF (CH)
Available
XLV, 344 p.
EA; E107; eBook; Nonbooks, PBS / Technik/Sonstiges; Elektronik; Verstehen; AFM; PES; REM; Raman spectroscopy; ceramics; elasticity; liquid; microscopy; modeling; polymer; spectroscopy; C; Nanotechnology and Microengineering; Spectroscopy and Microscopy; Surface and Interface Science, Thin Films; Nanotechnology; Surfaces and Interfaces, Thin Films; Polymer Sciences; Microsystems and MEMS; Spectroscopy; Surface and Interface and Thin Film; Nanotechnology; Surfaces, Interfaces and Thin Film; Polymers; Chemistry and Materials Science; Spektroskopie, Spektrochemie, Massenspektrometrie; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Nanotechnologie; Materialwissenschaft; Technische Anwendung von Polymeren und Verbundwerkstoffen; BB
Integrated Cantilevers and Atomic Force Microscopes.- Electrostatic Microscanner.- Low-Noise Methods for Optical Measurements of Cantilever Deflections.- Q-controlled Dynamic Force Microscopy in Air and Liquids.- High-Frequency Dynamic Force Microscopy.- Torsional Resonance Microscopy and Its Applications.- Modeling of Tip-Cantilever Dynamics in Atomic Force Microscopy.- Combined Scanning Probe Techniques for In-Situ Electrochemical Imaging at a Nanoscale.- New AFM Developments to Study Elasticity and Adhesion at the Nanoscale.- Near-Field Raman Spectroscopy and Imaging.Autres livres qui pourraient ressembler au livre recherché:
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