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Transmission Electron Microscopy : Diffraction, Imaging, and Spectrometry - David B. Williams
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Transmission Electron Microscopy : Diffraction, Imaging, and Spectrometry - edition reliée, livre de poche

2016, ISBN: 3319266497

[EAN: 9783319266497], Neubuch, [SC: 0.0], [PU: Springer International Publishing], CHEMIE; EXPERIMENT; VERSUCH; FESTKÖRPERPHYSIK; FORSCHUNG (NATURWISSENSCHAFTLICH); KÖRPER (PHYSIKALISCH) … Plus…

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Herausgegeben:Carter, C. Barry; Williams, David B.:

Transmission Electron Microscopy - edition reliée, livre de poche

2016, ISBN: 9783319266497

[ED: Hardcover], [PU: Springer / Springer International Publishing / Springer, Berlin], This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Scien… Plus…

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Transmission Electron Microscopy / Diffraction, Imaging, and Spectrometry / David B. Williams (u. a.) / Buch / HC runder Rücken kaschiert / xxxiii / Englisch / 2016 / Springer International Publishing - Williams, David B.
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Williams, David B.:
Transmission Electron Microscopy / Diffraction, Imaging, and Spectrometry / David B. Williams (u. a.) / Buch / HC runder Rücken kaschiert / xxxiii / Englisch / 2016 / Springer International Publishing - edition reliée, livre de poche

2016

ISBN: 9783319266497

[ED: Gebunden], [PU: Springer International Publishing], This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The … Plus…

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Williams, David B. (Herausgeber); Carter, C. Barry (Herausgeber):
Transmission Electron Microscopy Diffraction, Imaging, and Spectrometry - edition reliée, livre de poche

2016, ISBN: 3319266497

1st ed. 2016 Gebundene Ausgabe Chemie, Experiment, Versuch, Festkörperphysik, Forschung (naturwissenschaftlich), Körper (physikalisch) / Festkörper, Massenspektrometrie - Spektrometrie … Plus…

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Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry - Première édition

2016, ISBN: 9783319266497

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Springer, Gebundene Ausgabe, Auflage: 1st ed. 2016, 551 Seiten, Publiziert: 2016-09-05T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: 43903781, 15.1 kg, Verkaufsrang: 1086924, Maschinenb… Plus…

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Détails sur le livre
Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry
Auteur:
Titre:
ISBN:

9783319266497


This text is a companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter. The aim is to extend the discussion of certain topics that are either rapidly changing at this time or that would benefit from more detailed discussion than space allowed in the primary text. World-renowned researchers have contributed chapters in their area of expertise, and the editors have carefully prepared these chapters to provide a uniform tone and treatment for this exciting material. The book features an unparalleled collection of color figures showcasing the quality and variety of chemical data that can be obtained from today’s instruments, as well as key pitfalls to avoid. As with the previous TEM text, each chapter contains two sets of questions, one for self assessment and a second more suitable for homework assignments. Throughout the book, the style follows that of Williams & Carter even when the subject matter becomes challenging―the aim is always to make the topic understandable by first-year graduate students and others who are working in the field of Materials Science

Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Informations détaillées sur le livre - Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry


EAN (ISBN-13): 9783319266497
ISBN (ISBN-10): 3319266497
Version reliée
Date de parution: 2016
Editeur: Carter, C. Barry, Williams, David B. Springer

Livre dans la base de données depuis 2015-11-05T00:42:10+01:00 (Paris)
Page de détail modifiée en dernier sur 2023-12-11T13:53:09+01:00 (Paris)
ISBN/EAN: 9783319266497

ISBN - Autres types d'écriture:
3-319-26649-7, 978-3-319-26649-7
Autres types d'écriture et termes associés:
Auteur du livre: williams carter, david williams, barry william, william barr, wiliam barry
Titre du livre: transmission microscopy electron, verlag williams, barry, electron diffraction

Données de l'éditeur

Auteur: C. Barry Carter; David B. Williams
Titre: Transmission Electron Microscopy - Diffraction, Imaging, and Spectrometry
Editeur: Springer; Springer International Publishing
518 Pages
Date de parution: 2016-09-05
Cham; CH
Imprimé / Fabriqué en
Langue: Anglais
128,39 € (DE)
131,99 € (AT)
142,00 CHF (CH)
POD
XXXIII, 518 p. 300 illus.

BB; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; EELS; EFTEM; Electron Diffraction; Electron Holography; Electron Sources; Electron Tomography; Focal-series reconstruction; Operando TEM; Spectrum Imaging; TEM Textbook; Transmission Electron Microscopy; XEDS; Characterization and Analytical Technique; Nanophysics; Spectroscopy; Condensed Matter Physics; Solid Mechanics; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Nanowissenschaften; Spektroskopie, Spektrochemie, Massenspektrometrie; Maschinenbau: Festkörpermechanik; EA; BC

Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.

Transmission Electron Microscopy: A Textbook for Materials Science

Journal of Materials Science

by Williams and Carter:

“The best textbook for this audience available.” — American Scientist

“...highly readable, and an extremely valuable text for all users of the TEM at every level. Treat yourself to a copy!” — Microscopy and Microanalysis

“This book is written in such a comprehensive manner that it is understandable to all people who are trained in physical science and it will be useful both for the expert as well as the student.” — Micron

“The book answers nearly any question - be it instrumental, practical, or theoretical - either directly or with an appropriate reference...This book provides a basic, clear-cut presentation of how transmission electron microscopes should be used and of how this depends specifically on one's specific undergoing project.” — MRS Bulletin

“It is truly a book so thoughtfully written that … it will provide a solid foundation for those studying material science….an outstanding book.” — IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010

Transmission Electron Microscopy: A Textbook for Materials Science Transmission Electron Microscopy: A Textbook for Materials Science
An essential companion volume to Transmission Electron Microscopy: A Textbook for Materials Science by Williams and Carter Equips the reader with a clear and deep understanding of TEM, the essential tool for studying nanomaterials Presents advanced topics with the same look, feel, and approach that students already know from Williams & Carter Features chapters on diffraction, high-resolution imaging, and chemical mapping by the leading experts in the field Provides the fundamentals for students to understand and interpret the results of electron tomography and electron holography, even if they will not employ these techniques themselves Includes supplementary material: sn.pub/extras
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