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Advanced Test Methods for Srams - Bosio, Alberto; Dilillo, Luigi; Girard, Patrick
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Bosio, Alberto; Dilillo, Luigi; Girard, Patrick:
Advanced Test Methods for Srams - Livres de poche

2009, ISBN: 1441909397, Lieferbar binnen 4-6 Wochen Frais d'envoiVersandkostenfrei innerhalb der BRD

ID: 9781441909398

Internationaler Buchtitel. In englischer Sprache. Verlag: SPRINGER VERLAG GMBH, 188 Seiten, L=156mm, B=234mm, H=10mm, Gew.=272gr, [GR: 26830 - TB/Maschinenbau/Fertigungstechnik], [SW: - Technology & Industrial Arts], Kartoniert/Broschiert, Klappentext: Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults," are not covered by classical test solutions and require the dedicated test sequences presented in this book. Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults," are not covered by classical test solutions and require the dedicated test sequences presented in this book.

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Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults," are not covered by classical test solutions and require the dedicated test sequences presented in this book.

Informations détaillées sur le livre - Advanced Test Methods for Srams


EAN (ISBN-13): 9781441909398
ISBN (ISBN-10): 1441909397
Livre de poche
Date de parution: 2009
Editeur: SPRINGER VERLAG GMBH
188 Pages
Poids: 0,272 kg
Langue: eng/Englisch

Livre dans la base de données depuis 22.06.2011 08:14:59
Livre trouvé récemment le 22.06.2011 08:14:59
ISBN/EAN: 9781441909398

ISBN - Autres types d'écriture:
1-4419-0939-7, 978-1-4419-0939-8


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