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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / Alberto Bosio (u. a.) / Buch / XV / Englisch / 2009 / Springer US / EAN 9781441909374 - Bosio, Alberto
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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies / Alberto Bosio (u. a.) / Buch / XV / Englisch / 2009 / Springer US / EAN 9781441909374 - edition reliée, livre de poche

2009, ISBN: 9781441909374

[ED: Gebunden], [PU: Springer US], Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to… Plus…

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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies | Alberto Bosio (u. a.) | Buch | XV | Englisch | 2009 | Springer US | EAN 9781441909374 - Bosio, Alberto
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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies | Alberto Bosio (u. a.) | Buch | XV | Englisch | 2009 | Springer US | EAN 9781441909374 - edition reliée, livre de poche

2009, ISBN: 9781441909374

[ED: Gebunden], [PU: Springer US], Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to… Plus…

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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel
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Alberto Bosio/ Luigi Dilillo/ Patrick Girard/ Serge Pravossoudovitch/ Arnaud Virazel:
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Bosio, Alberto, Dilillo, Luigi, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud
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Bosio, Alberto, Dilillo, Luigi, Girard, Patrick, Pravossoudovitch, Serge, Virazel, Arnaud:
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - edition reliée, livre de poche

2009, ISBN: 9781441909374

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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel
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Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel:
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - edition reliée, livre de poche

2009, ISBN: 1441909370

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Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
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9781441909374


Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book. TOC:Introduction.-Basics on SRAM Memory Testing.-Resistive-Open Defects in Core-Cells.-Open Defects in Pre-Charge Circuits.-Resistive-Open Defects in Address Decoders.-Resistive-Open Defects in Write Drivers.-Resistive-Open Defects in Sense Amplifiers.-Faults due to Process Variations in SRAMs.-Diagnosis of Dynamic Faults.-Conclusion.

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EAN (ISBN-13): 9781441909374
ISBN (ISBN-10): 1441909370
Version reliée
Livre de poche
Date de parution: 2009
Editeur: SPRINGER NATURE
171 Pages
Poids: 0,431 kg
Langue: eng/Englisch

Livre dans la base de données depuis 2007-07-16T19:12:18+02:00 (Paris)
Page de détail modifiée en dernier sur 2023-10-14T15:12:35+02:00 (Paris)
ISBN/EAN: 9781441909374

ISBN - Autres types d'écriture:
1-4419-0937-0, 978-1-4419-0937-4
Autres types d'écriture et termes associés:
Auteur du livre: bosio, luigi, serge, girard patrick, arnaud, generation
Titre du livre: test, advanced method, sram

Données de l'éditeur

Auteur: Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel
Titre: Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Editeur: Springer; Springer US
171 Pages
Date de parution: 2009-11-04
New York; NY; US
Imprimé / Fabriqué en
Langue: Anglais
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
XV, 171 p.

BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Dynamic Memory Faults; Electronic Testing; Memory Testing; Nanoscale Testing; SRAM; Semiconductor Memories; Semiconductor Testing; Technologie; currmssc; design; diagnosis; electronics; semiconductor; technology; testing; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Computer-Aided Design (CAD); BC

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.
First book to present complete, state-of-the-art coverage of dynamic fault memory testing Presents content using a "bottom-up" approach, from the electrical causes of malfunction up to the generation of smart test strategies Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.) Includes Spice simulation files and an SRAM logic fault simulator Includes supplementary material: sn.pub/extras
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