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Handbook of Charged Particle Optics, Second Edition - Jon Orloff
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Jon Orloff:
Handbook of Charged Particle Optics, Second Edition - edition reliée, livre de poche

ISBN: 1420045547

[SR: 2987741], Hardcover, [EAN: 9781420045543], CRC Press, CRC Press, Book, [PU: CRC Press], CRC Press, With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentatio, 227550, Industrial, Manufacturing & Operational Systems, 10806600011, 3D Printing, 52166011, Economics, 13755, Ergonomics, 7921652011, Health & Safety, 13762, Industrial Design, 227551, Industrial Technology, 52167011, Management, 13769, Manufacturing, 13773, Production, Operation & Management, 8082407011, Project Management, 13799, Quality Control, 13687, Robotics & Automation, 173515, Engineering, 173507, Engineering & Transportation, 1000, Subjects, 283155, Books, 14563, Light, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 14589, Optics, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 468216, Science & Mathematics, 491690, Agriculture, 491700, Astronomy & Astrophysics, 491702, Biology & Life Sciences, 491718, Chemistry, 491730, Earth Sciences, 684290011, Environmental Studies, 468218, Mathematics, 684291011, Mechanics, 491732, Physics, 465600, New, Used & Rental Textbooks, 2349030011, Specialty Boutique, 283155, Books

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Handbook of Charged Particle Optics, Second Edition - Jon Orloff
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Jon Orloff:
Handbook of Charged Particle Optics, Second Edition - edition reliée, livre de poche

ISBN: 1420045547

[SR: 3091368], Hardcover, [EAN: 9781420045543], CRC Press, CRC Press, Book, [PU: CRC Press], CRC Press, With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentatio, 227550, Industrial, Manufacturing & Operational Systems, 10806600011, 3D Printing, 52166011, Economics, 13755, Ergonomics, 7921652011, Health & Safety, 13762, Industrial Design, 227551, Industrial Technology, 52167011, Management, 13769, Manufacturing, 13773, Production, Operation & Management, 8082407011, Project Management, 13799, Quality Control, 13687, Robotics & Automation, 173515, Engineering, 173507, Engineering & Transportation, 1000, Subjects, 283155, Books, 14563, Light, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 14589, Optics, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 468216, Science & Mathematics, 491690, Agriculture, 491700, Astronomy & Astrophysics, 491702, Biology & Life Sciences, 491718, Chemistry, 491730, Earth Sciences, 684290011, Environmental Studies, 468218, Mathematics, 684291011, Mechanics, 491732, Physics, 465600, New, Used & Rental Textbooks, 2349030011, Specialty Boutique, 283155, Books

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Handbook of Charged Particle Optics, Second Edition - Jon Orloff
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Jon Orloff:
Handbook of Charged Particle Optics, Second Edition - edition reliée, livre de poche

ISBN: 1420045547

[SR: 3091368], Hardcover, [EAN: 9781420045543], CRC Press, CRC Press, Book, [PU: CRC Press], CRC Press, With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentatio, 227550, Industrial, Manufacturing & Operational Systems, 10806600011, 3D Printing, 52166011, Economics, 13755, Ergonomics, 7921652011, Health & Safety, 13762, Industrial Design, 227551, Industrial Technology, 52167011, Management, 13769, Manufacturing, 13773, Production, Operation & Management, 8082407011, Project Management, 13799, Quality Control, 13687, Robotics & Automation, 173515, Engineering, 173507, Engineering & Transportation, 1000, Subjects, 283155, Books, 14563, Light, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 14589, Optics, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 468216, Science & Mathematics, 491690, Agriculture, 491700, Astronomy & Astrophysics, 491702, Biology & Life Sciences, 491718, Chemistry, 491730, Earth Sciences, 684290011, Environmental Studies, 468218, Mathematics, 684291011, Mechanics, 491732, Physics, 465600, New, Used & Rental Textbooks, 2349030011, Specialty Boutique, 283155, Books

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Handbook of Charged Particle Optics, Second Edition - Jon Orloff
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Jon Orloff:
Handbook of Charged Particle Optics, Second Edition - edition reliée, livre de poche

ISBN: 1420045547

[SR: 2987741], Hardcover, [EAN: 9781420045543], CRC Press, CRC Press, Book, [PU: CRC Press], CRC Press, With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The book’s unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the field’s cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentatio, 227550, Industrial, Manufacturing & Operational Systems, 10806600011, 3D Printing, 52166011, Economics, 13755, Ergonomics, 7921652011, Health & Safety, 13762, Industrial Design, 227551, Industrial Technology, 52167011, Management, 13769, Manufacturing, 13773, Production, Operation & Management, 8082407011, Project Management, 13799, Quality Control, 13687, Robotics & Automation, 173515, Engineering, 173507, Engineering & Transportation, 1000, Subjects, 283155, Books, 14563, Light, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 14589, Optics, 14545, Physics, 75, Science & Math, 1000, Subjects, 283155, Books, 468216, Science & Mathematics, 491690, Agriculture, 491700, Astronomy & Astrophysics, 491702, Biology & Life Sciences, 491718, Chemistry, 491730, Earth Sciences, 684290011, Environmental Studies, 468218, Mathematics, 684291011, Mechanics, 491732, Physics, 465600, New, Used & Rental Textbooks, 2349030011, Specialty Boutique, 283155, Books

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Handbook of Charged Particle Optics, Second Edition - Orloff, Jon
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Orloff, Jon:
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ISBN: 9781420045543

ID: 365514

Review of ZrO/W Schottky Cathode L. W. Swanson and G. A. Schwind Liquid Metal Ion Sources R. G. Forbes and (the late) G. L. R. Mair Gas Field Ionization Sources R. G. Forbes Magnetic Lenses for Electron Microscopy K. Tsuno Electrostatic Lenses B. Lencov Aberrations P. W. Hawkes Space Charge and Statistical Coulomb Effects P. Kruit and G. H. Jansen Resolution M. Sato Scanning Electron Microscope A. E. Vladr and M. T. Postek Scanning Transmission Electron Microscope A. V. Crewe (updated by P. D. Nellist) Focused Ion Beams M. Utlaut Aberration Correction in Electron Microscopy O. L. Krivanek, N. Dellby and M. F. Murffitt Appendix: Computational Resources for Electron Microscopy J. Orloff (with valuable information from P. W. Hawkes and B. Lencov) Index Technology Technology eBook, CRC Press

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Détails sur le livre
Handbook of Charged Particle Optics

<P>Balancing its coverage of theory with a wide range of application areas, Handbook of Charged Particle Optics provides a complete guide to understanding, designing, and using high resolution instrumentation such as scanning electron microscope (SEM), scanning transmission electron microscope (STEM), and focused ion beam (FIB) systems. This second edition features new chapters on aberration correction, the transmission electron microscope (TEM), and applications of gas phase field ionization sources. Including additional references to past and present work in the field, this comprehensive text also presents up-to-date information of Schottky electron as well as liquid metal ion sources.</P>

Informations détaillées sur le livre - Handbook of Charged Particle Optics


EAN (ISBN-13): 9781420045543
ISBN (ISBN-10): 1420045547
Version reliée
Livre de poche
Date de parution: 2008
Editeur: CRC PR INC
665 Pages
Poids: 1,361 kg
Langue: eng/Englisch

Livre dans la base de données depuis 02.02.2009 14:13:06
Livre trouvé récemment le 03.11.2017 14:31:45
ISBN/EAN: 9781420045543

ISBN - Autres types d'écriture:
1-4200-4554-7, 978-1-4200-4554-3


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