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Electrical Characterization of Silicon-on-Insulator Materials and Devices - Sorin Cristoloveanu, Sheng S. Li
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Sorin Cristoloveanu, Sheng S. Li:

Electrical Characterization of Silicon-on-Insulator Materials and Devices - nouveau livre

ISBN: 9780792395485

ID: 978079239548

Electrical Characterization of Silicon-on-Insulator Materials and Devices describes a wide variety of electrical characterization methods, from wafer screening and defect identification to detailed device evaluation. Each technique comes with pertinent technical information -- experimental set-up, basic models, parameter extraction -- that can be immediately useful to the reader. Electrical Characterization of Silicon-on-Insulator Materials and Devices provides a comprehensive and accessible treatment of all aspects of the latest SOI technologies, including material synthesis, device physics, characterization, circuit applications, and reliability issues. Both the academic researchers and engineers working on the SOI technology will find this book invaluable as a source of pertinent scientific information, practical details, and references. For people planning to enter the SOI field, this book offers a unique coverage of the SOI technology and an attractive presentation of the underlying concepts. This book may also be used as a graduate level textbook for students who wish to learn more about the physics, applications, and electrical characterization of SOI devices. Sorin Cristoloveanu, Sheng S. Li, Books, Science and Nature, Electrical Characterization of Silicon-on-Insulator Materials and Devices Books>Science and Nature, Springer

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Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science) - Sorin Cristoloveanu, Sheng Li
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Sorin Cristoloveanu, Sheng Li:
Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science) - edition reliée, livre de poche

ISBN: 0792395484

Gebundene Ausgabe, [EAN: 9780792395485], Springer, Springer, Book, [PU: Springer], Springer, 60518011, Prinzip der Elektrizität, 60516011, Elektrotechnik, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 60537011, Halbleiter, 60516011, Elektrotechnik, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 60556011, Materialwissenschaft, 60448011, Ingenieurwesen & Technik, 60447011, Architektur, Technik & Ingenieurswesen, 54071011, Genres, 52044011, Fremdsprachige Bücher, 56441011, Technologie, 56447011, Erneuerbare Energien, 56448011, Innovationen, 1320311031, Nachschlagewerke, 56444011, Nanotechnologie, 56449011, Philosophie der Technologie, 56445011, Risiken, 56446011, Sicherheit & Gesundheit, 273011011, Soziale Aspekte, 54518011, Technisches Denken & Schreiben, 56451011, Technologie & Gesellschaft, 56211011, Technologiegeschichte, 56442011, Zukunftsforschung, 56047011, Wissenschaft, 54071011, Genres, 52044011, Fremdsprachige Bücher

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Electrical Characterization of Silicon-on-Insulator Materials and Devices - Sorin Cristoloveanu; Sheng Li
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Electrical Characterization of Silicon-on-Insulator Materials and Devices - nouveau livre

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Engineering; Electrical Engineering; Optical and Electronic Materials Diode, electronics, material, microelectronics, transistor, Wafer Books Book, Springer Science+Business Media

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Electrical Characterization of Silicon-on-Insulator Materials and Devices - Sheng Li  Sorin Cristoloveanu
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Electrical Characterization of Silicon-on-Insulator Materials and Devices - nouveau livre

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Détails sur le livre
Electrical Characterization of Silicon-on-Insulator Materials and Devices
Auteur:

Cristoloveanu, Sorin; Li, Sheng S.; Li Sheng S.

Titre:

Electrical Characterization of Silicon-on-Insulator Materials and Devices

ISBN:

9780792395485

Electrical Characterization of Silicon-on-Insulator Materials and Devices describes a wide variety of electrical characterization methods, from wafer screening and defect identification to detailed device evaluation. Each technique comes with pertinent technical information -- experimental set-up, basic models, parameter extraction -- that can be immediately useful to the reader. Electrical Characterization of Silicon-on-Insulator Materials and Devices provides a comprehensive and accessible treatment of all aspects of the latest SOI technologies, including material synthesis, device physics, characterization, circuit applications, and reliability issues. Both the academic researchers and engineers working on the SOI technology will find this book invaluable as a source of pertinent scientific information, practical details, and references. For people planning to enter the SOI field, this book offers a unique coverage of the SOI technology and an attractive presentation of the underlying concepts. This book may also be used as a graduate level textbook for students who wish to learn more about the physics, applications, and electrical characterization of SOI devices.

Informations détaillées sur le livre - Electrical Characterization of Silicon-on-Insulator Materials and Devices


EAN (ISBN-13): 9780792395485
ISBN (ISBN-10): 0792395484
Version reliée
Date de parution: 1995
Editeur: Springer-Verlag GmbH
400 Pages
Poids: 0,760 kg

Livre dans la base de données depuis 18.11.2007 04:22:02
Livre trouvé récemment le 09.02.2017 08:00:22
ISBN/EAN: 9780792395485

ISBN - Autres types d'écriture:
0-7923-9548-4, 978-0-7923-9548-5

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