Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49) - edition reliée, livre de poche
2012, ISBN: 9783642273803
Springer, Gebundene Ausgabe, Auflage: 2013, 548 Seiten, Publiziert: 2012-10-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 20.72 kg, Maschinenbau, Ingenieurwissenschaften, … Plus…
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Auger- And X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - edition reliée, livre de poche
2012, ISBN: 9783642273803
Hard cover, New., Sewn binding. Cloth over boards. 528 p. Contains: Unspecified. Springer Surface Sciences, 49., Berlin, Heidelberg, [PU: Springer]
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49) - edition reliée, livre de poche
2012, ISBN: 3642273807
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Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - edition reliée, livre de poche
2012, ISBN: 3642273807
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Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-oriented Guide - edition reliée, livre de poche
2013, ISBN: 9783642273803
Springer Verlag, 2012. Hardcover. New. 2013 edition. 547 pages. 9.25x6.00x1.00 inches., Springer Verlag, 2012, 6
Biblio.co.uk |
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49) - edition reliée, livre de poche
2012, ISBN: 9783642273803
Springer, Gebundene Ausgabe, Auflage: 2013, 548 Seiten, Publiziert: 2012-10-25T00:00:01Z, Produktgruppe: Buch, Hersteller-Nr.: biography, 20.72 kg, Maschinenbau, Ingenieurwissenschaften, … Plus…
Hofmann, Siegfried:
Auger- And X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - edition reliée, livre de poche2012, ISBN: 9783642273803
Hard cover, New., Sewn binding. Cloth over boards. 528 p. Contains: Unspecified. Springer Surface Sciences, 49., Berlin, Heidelberg, [PU: Springer]
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49) - edition reliée, livre de poche
2012
ISBN: 3642273807
[EAN: 9783642273803], Neubuch, [PU: Springer], Clean and crisp and new!, Books
Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide - edition reliée, livre de poche
2012, ISBN: 3642273807
[EAN: 9783642273803], Gebraucht, wie neu, [PU: Springer 2012-10-25], Item is in new condition., Books
Auger- and X-ray Photoelectron Spectroscopy in Materials Science: A User-oriented Guide - edition reliée, livre de poche
2013, ISBN: 9783642273803
Springer Verlag, 2012. Hardcover. New. 2013 edition. 547 pages. 9.25x6.00x1.00 inches., Springer Verlag, 2012, 6
Données bibliographiques du meilleur livre correspondant
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To anyone who is interested in surface chemical analysis of materials on the nanometer scale, this book is prepared to give appropriate information. Based on typical application examples in materials science, a concise approach to all aspects of quantitative analysis of surfaces and thin films with AES and XPS is provided. Starting from basic principles which are step by step developed into practically useful equations, extensive guidance is given to graduate students as well as to experienced researchers. Key chapters are those on quantitative surface analysis and on quantitative depth profiling, including recent developments in topics such as surface excitation parameter and backscattering correction factor. Basic relations are derived for emission and excitation angle dependencies in the analysis of bulk material and of fractional nano-layer structures, and for both smooth and rough surfaces. It is shown how to optimize the analytical strategy, signal-to-noise ratio, certainty and detection limit. Worked examples for quantification of alloys and of layer structures in practical cases (e.g. contamination, evaporation, segregation and oxidation) are used to critically review different approaches to quantification with respect to average matrix correction factors and matrix relative sensitivity factors. State-of-the-art issues in quantitative, destructive and non-destructive depth profiling are discussed with emphasis on sputter depth profiling and on angle resolved XPS and AES. Taking into account preferential sputtering and electron backscattering corrections, an introduction to the mixing-roughness-information depth (MRI) model and its extensions is presented.
Informations détaillées sur le livre - Auger- and X-Ray Photoelectron Spectroscopy in Materials Science: A User-Oriented Guide (Springer Series in Surface Sciences, 49, Band 49)
EAN (ISBN-13): 9783642273803
ISBN (ISBN-10): 3642273807
Version reliée
Date de parution: 2012
Editeur: Springer
528 Pages
Poids: 0,939 kg
Langue: Englisch
Livre dans la base de données depuis 2007-06-19T21:28:18+02:00 (Paris)
Page de détail modifiée en dernier sur 2023-08-09T18:04:24+02:00 (Paris)
ISBN/EAN: 3642273807
ISBN - Autres types d'écriture:
3-642-27380-7, 978-3-642-27380-3
Autres types d'écriture et termes associés:
Auteur du livre: hofman, siegfried hofmann, hofmann else, siegfried springer
Titre du livre: before science, material sciences, materials sciences, surface science series, user guide, ray spectroscopy
Données de l'éditeur
Auteur: Siegfried Hofmann
Titre: Springer Series in Surface Sciences; Auger- and X-Ray Photoelectron Spectroscopy in Materials Science - A User-Oriented Guide
Editeur: Springer; Springer Berlin
528 Pages
Date de parution: 2012-10-25
Berlin; Heidelberg; DE
Imprimé / Fabriqué en
Langue: Anglais
320,99 € (DE)
329,99 € (AT)
354,00 CHF (CH)
POD
XX, 528 p.
BB; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; Auger electron spectroscopy; interface analysis; scanning Auger microscopy; surface analysis; thin-film depth profiling; Condensed Matter Physics; Spectroscopy; Surfaces, Interfaces and Thin Film; Spektroskopie, Spektrochemie, Massenspektrometrie; Materialwissenschaft; BC
Outline of the Technique/Brief Description.- Theoretical Background.- Instrumentation.- Practical Surface Analysis with AES.- Data Evaluation/Quantification.- Problem Solving with AES (Examples).This is the most comprehensive book available on this widely used analytical technique Includes supplementary material: sn.pub/extras
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