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Power-Aware Testing and Test Strategies for Low Power Devices
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Power-Aware Testing and Test Strategies for Low Power Devices - Livres de poche

2010, ISBN: 144190929X, Lieferbar binnen 4-6 Wochen Frais d'envoiVersandkostenfrei innerhalb der BRD

ID: 9781441909299

Internationaler Buchtitel. In englischer Sprache. Verlag: SPRINGER VERLAG GMBH, 388 Seiten, L=156mm, B=234mm, H=20mm, Gew.=540gr, [GR: 26830 - TB/Maschinenbau/Fertigungstechnik], [SW: - Technology & Industrial Arts], Kartoniert/Broschiert, Klappentext: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

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Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Informations détaillées sur le livre - Power-Aware Testing and Test Strategies for Low Power Devices


EAN (ISBN-13): 9781441909299
ISBN (ISBN-10): 144190929X
Livre de poche
Date de parution: 2010
Editeur: SPRINGER VERLAG GMBH
388 Pages
Poids: 0,540 kg
Langue: eng/Englisch

Livre dans la base de données depuis 04.01.2011 09:06:17
Livre trouvé récemment le 04.01.2011 09:06:17
ISBN/EAN: 144190929X

ISBN - Autres types d'écriture:
1-4419-0929-X, 978-1-4419-0929-9


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