ISBN: 9780792395485
Silicon on Insulator is more than a technology, more than a job, and more than a venture in microelectronics; it is something different and refreshing in device physics. This book recalls… Plus…
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Electrical Characterization of Silicon-on-Insulator Materials and Devices (Hardback) - edition reliée, livre de poche
1995, ISBN: 0792395484
[EAN: 9780792395485], Neubuch, [PU: Springer, Netherlands], Language: English. Brand new Book. Silicon on Insulator is more than a technology, more than a job, and more than a venture in … Plus…
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Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science, 305, Band 305) - edition reliée, livre de poche
1995, ISBN: 9780792395485
Springer, Gebundene Ausgabe, Auflage: 1995, 396 Seiten, Publiziert: 1995-06-30T00:00:01Z, Produktgruppe: Buch, 3.57 kg, Verkaufsrang: 8131, Hardware & Technik, Computer & Internet, Katego… Plus…
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Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science, 305, Band 305) - edition reliée, livre de poche
1995, ISBN: 9780792395485
Springer, Gebundene Ausgabe, Auflage: 1995, 396 Seiten, Publiziert: 1995-06-30T00:00:01Z, Produktgruppe: Buch, 3.57 kg, Verkaufsrang: 8131, Hardware & Technik, Computer & Internet, Katego… Plus…
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Electrical Characterization of Silicon-On-Insulator Materials and Devices by Sorin Cristoloveanu Hardcover | Indigo Chapters - nouveau livre
ISBN: 9780792395485
Silicon on Insulator is more than a technology, more than a job, and more than a venture in microelectronics; it is something different and refreshing in device physics. This book recalls… Plus…
Sorin Cristoloveanu, Sheng Li:
Electrical Characterization of Silicon-on-Insulator Materials and Devices (Hardback) - edition reliée, livre de poche1995, ISBN: 0792395484
[EAN: 9780792395485], Neubuch, [PU: Springer, Netherlands], Language: English. Brand new Book. Silicon on Insulator is more than a technology, more than a job, and more than a venture in … Plus…
Electrical Characterization of Silicon-on-Insulator Materials and Devices (Hardback) - edition reliée, livre de poche
1995
ISBN: 0792395484
[EAN: 9780792395485], Neubuch, [PU: Springer, Netherlands], Language: English. Brand new Book. Silicon on Insulator is more than a technology, more than a job, and more than a venture in … Plus…
Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science, 305, Band 305) - edition reliée, livre de poche
1995, ISBN: 9780792395485
Springer, Gebundene Ausgabe, Auflage: 1995, 396 Seiten, Publiziert: 1995-06-30T00:00:01Z, Produktgruppe: Buch, 3.57 kg, Verkaufsrang: 8131, Hardware & Technik, Computer & Internet, Katego… Plus…
Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science, 305, Band 305) - edition reliée, livre de poche
1995, ISBN: 9780792395485
Springer, Gebundene Ausgabe, Auflage: 1995, 396 Seiten, Publiziert: 1995-06-30T00:00:01Z, Produktgruppe: Buch, 3.57 kg, Verkaufsrang: 8131, Hardware & Technik, Computer & Internet, Katego… Plus…
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Informations détaillées sur le livre - Electrical Characterization of Silicon-on-Insulator Materials and Devices (The Springer International Series in Engineering and Computer Science, 305, Band 305)
EAN (ISBN-13): 9780792395485
ISBN (ISBN-10): 0792395484
Version reliée
Date de parution: 1995
Editeur: Springer
400 Pages
Poids: 0,760 kg
Livre dans la base de données depuis 2007-11-18T04:22:02+01:00 (Paris)
Page de détail modifiée en dernier sur 2022-12-01T15:52:17+01:00 (Paris)
ISBN/EAN: 0792395484
ISBN - Autres types d'écriture:
0-7923-9548-4, 978-0-7923-9548-5
Autres types d'écriture et termes associés:
Auteur du livre: sorin, sheng
Titre du livre: silicon, the science and engineering materials, electrical materials, devices wonder, electrical engineering material, characterization materials
Données de l'éditeur
Auteur: Sorin Cristoloveanu; Sheng Li
Titre: The Springer International Series in Engineering and Computer Science; Electrical Characterization of Silicon-on-Insulator Materials and Devices
Editeur: Springer; Springer US
381 Pages
Date de parution: 1995-06-30
New York; NY; US
Langue: Anglais
213,99 € (DE)
219,99 € (AT)
236,00 CHF (CH)
Available
XV, 381 p.
BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Elektrotechnik; Verstehen; Diode; electronics; material; microelectronics; transistor; Wafer; Electrical and Electronic Engineering; Optical Materials; Technische Anwendung von elektronischen, magnetischen, optischen Materialien; EA; BC
Preface.- 1 Introduction.- 1.1 Why SOI ?.- 1.2 Why Not Yet SOI ?.- 1.3 Why an SOI Book?.- 2 Methods of Forming SOI Wafers.- 2.1 SIMOX.- 2.2 Wafer Bonding.- 2.3 Zone-Melting Recrystallization.- 2.4 Epitaxial Lateral Overgrowth.- 2.5 Full Isolation by Porous Oxidized Silicon.- 2.6 Silicon on Sapphire.- 2.7 Silicon on Zirconia.- 3 SOI Devices.- 3.1 Advanced CMOS and Bipolar Devices.- 3.2 Radiation-Hardened Circuits.- 3.3 High-Voltage Devices.- 3.4 High-Temperature Devices.- 3.5 Low-Power Applications.- 3.6 Three-Dimensional Devices.- 3.7 Transducers.- 3.8 Innovative Devices.- 4 Wafer-Screening Techniques.- 4.1 The Basis for Wafer Screening.- 4.2 Surface Photovoltage.- 4.3 Dual-Beam S-Polarized Reflectance.- 4.4 Dual-Beam Optical Modulation.- 4.5 Other Optical Methods.- 4.6 Point Contact Pseudo-MOS Transistor.- 4.7 Quick-Turnaround Capacitance.- 4.8 Pinhole Detection.- 4.9 Conclusion.- 5 Transport Measurements.- 5.1 Four-Point Probe.- 5.2 Spreading Resistance.- 5.3 Hall Effect and Magnetoresistance.- 5.4 Van der Pauw Measurements.- 5.5 Photoconductivity.- 5.6 PICTS.- 6 SIS Capacitor-Based Characterization Techniques.- 6.1 Capacitance and Conductance Techniques.- 6.2 Bias-Scan DLTS Technique.- 6.4 Zerbst Method and Generation Lifetime.- 6.5 MOS Capacitance Method.- 7 Diode Measurements.- 7.1 Current—Voltage Measurements in a P—N Diode.- 7.2 Differential Current/Capacitance Method.- 7.3 Gated-Diode Measurements.- 7.4 Deep-Level Transient Spectroscopy.- 8 Electrical Characterization of SOI Materials and Devices MOS Transistor Characteristics.- 9 Transistor-Based Characterization Techniques.- List of Symbols.Autres livres qui pourraient ressembler au livre recherché:
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9781461522454 Electrical Characterization of Silicon-on-Insulator Materials and Devices (Sorin Cristoloveanu; Sheng Li)
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