2014, ISBN: 9781489983138

[ED: Taschenbuch / Paperback], [PU: Springer Springer US Springer, Berlin], KURZE BESCHREIBUNG/ANMERKUNGEN: Power-aware testing methods for conventional circuits and systems are explored … Plus…

[ED: Taschenbuch / Paperback], [PU: Springer Springer US Springer, Berlin], KURZE BESCHREIBUNG/ANMERKUNGEN: Power-aware testing methods for conventional circuits and systems are explored in this volume, while providing safe testing techniques without compromising reliability. State-of-the-art industrial practices are discusses, as well as EDA solutions. AUSFÜHRLICHERE BESCHREIBUNG: Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. INHALT: Fundamentals of VLSI Testing.- Power Issues During Test.- Low-Power Test Pattern Generation.- Power-Aware Design-for-Test.- Power-Aware Test Data Compression and BIST.- Power-Aware System-Level Test Planning.- Low-Power Design Techniques and Test Implications.- Test Strategies for Multivoltage Designs.- Test Strategies for Gated Clock Designs.- Test of Power Management Structures.- EDA Solution for Power-Aware Design-for-Test., DE, [SC: 0.00], Neuware, gewerbliches Angebot, H: 235mm, B: 155mm, T: 20mm, 363, [GW: 593g], Selbstabholung und Barzahlung, PayPal, Offene Rechnung, Banküberweisung, Internationaler Versand<

2014, ISBN: 9781489983138

[ED: Softcover], [PU: Springer / Springer US / Springer, Berlin], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the sem… Plus…

[ED: Softcover], [PU: Springer / Springer US / Springer, Berlin], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. 2010. 2014. xxi, 363 S. 24 Tabellen. 235 mm Versandfertig in 6-10 Tagen, DE, [SC: 0.00], Neuware, gewerbliches Angebot, Offene Rechnung (Vorkasse vorbehalten)<

2014, ISBN: 9781489983138

[ED: Softcover], [PU: Springer / Springer US / Springer, Berlin], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the sem… Plus…

[ED: Softcover], [PU: Springer / Springer US / Springer, Berlin], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. 2010. 2014. xxi, 363 S. XXI, 363 p. 235 mm Versandfertig in 6-10 Tagen, DE, [SC: 0.00], Neuware, gewerbliches Angebot, Offene Rechnung (Vorkasse vorbehalten)<

2014, ISBN: 9781489983138

[ED: Softcover], [PU: Springer / Springer US / Springer, Berlin], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the sem… Plus…

[ED: Softcover], [PU: Springer / Springer US / Springer, Berlin], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices. 2010. 2014. xxi, 363 S. 24 Tabellen. 235 mm Sofort lieferbar, DE, [SC: 0.00], Neuware, gewerbliches Angebot, Offene Rechnung (Vorkasse vorbehalten)<

2014, ISBN: 9781489983138

Buch, Softcover, 2010 ed. [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2014