2014, ISBN: 1489983147
[EAN: 9781489983145], Neubuch, [PU: Springer US], DYNAMICMEMORYFAULTS ELECTRONICTESTING MEMORYTESTING NANOSCALETESTING SRAM SEMICONDUCTORMEMORIES SEMICONDUCTORTESTING TECHNOLOGIE CURRMSSC… Plus…
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2014, ISBN: 9781489983145
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Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - nouveau livre
2014, ISBN: 1489983147
2010 Kartoniert / Broschiert Computer-Aided Design (CAD), Dynamic Memory Faults; Electronic Testing; Memory Testing; Nanoscale Testing; SRAM; Semiconductor Memories; Semiconductor Testi… Plus…
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Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - nouveau livre
2014, ISBN: 1489983147
2010 Kartoniert / Broschiert Computer-Aided Design (CAD), DynamicMemoryFaults; ElectronicTesting; MemoryTesting; SemiconductorMemories; Design; diagnosis; Semiconductor; technology; tes… Plus…
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2010, ISBN: 1489983147
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2014, ISBN: 1489983147
[EAN: 9781489983145], Neubuch, [PU: Springer US], DYNAMICMEMORYFAULTS ELECTRONICTESTING MEMORYTESTING NANOSCALETESTING SRAM SEMICONDUCTORMEMORIES SEMICONDUCTORTESTING TECHNOLOGIE CURRMSSC… Plus…
Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel:
Advanced Test Methods for SRAMs - Livres de poche2014, ISBN: 9781489983145
[ED: Kartoniert / Broschiert], [PU: Springer US], Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book to present complete, state-of… Plus…
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - nouveau livre
2014
ISBN: 1489983147
2010 Kartoniert / Broschiert Computer-Aided Design (CAD), Dynamic Memory Faults; Electronic Testing; Memory Testing; Nanoscale Testing; SRAM; Semiconductor Memories; Semiconductor Testi… Plus…
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - nouveau livre
2014, ISBN: 1489983147
2010 Kartoniert / Broschiert Computer-Aided Design (CAD), DynamicMemoryFaults; ElectronicTesting; MemoryTesting; SemiconductorMemories; Design; diagnosis; Semiconductor; technology; tes… Plus…
2010, ISBN: 1489983147
Advanced Test Methods for SRAMs ab 109.99 € als Taschenbuch: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies. Auflage 2010. Aus dem Bereich: Bücher, Taschenbüch… Plus…
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Informations détaillées sur le livre - Advanced Test Methods for SRAMs
EAN (ISBN-13): 9781489983145
ISBN (ISBN-10): 1489983147
Livre de poche
Date de parution: 2014
Editeur: Springer-Verlag New York Inc.
Livre dans la base de données depuis 2014-10-05T17:04:52+02:00 (Paris)
Page de détail modifiée en dernier sur 2024-04-15T13:24:43+02:00 (Paris)
ISBN/EAN: 1489983147
ISBN - Autres types d'écriture:
1-4899-8314-7, 978-1-4899-8314-5
Autres types d'écriture et termes associés:
Auteur du livre: girard, bosio, patrick, arnaud
Titre du livre: test, sram, effective
Données de l'éditeur
Auteur: Alberto Bosio; Luigi Dilillo; Patrick Girard; Serge Pravossoudovitch; Arnaud Virazel
Titre: Advanced Test Methods for SRAMs - Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Editeur: Springer; Springer US
171 Pages
Date de parution: 2014-09-03
New York; NY; US
Imprimé / Fabriqué en
Langue: Anglais
109,99 € (DE)
113,07 € (AT)
121,50 CHF (CH)
POD
XV, 171 p.
BC; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Dynamic Memory Faults; Electronic Testing; Memory Testing; Nanoscale Testing; SRAM; Semiconductor Memories; Semiconductor Testing; Technologie; currmssc; design; diagnosis; electronics; semiconductor; technology; testing; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Computer-Aided Design (CAD); BB; EA
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by: Alberto Bosio Luigi Dilillo Patrick Girard Serge Pravossoudovitch Arnaud Virazel Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book. First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories; Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies; Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.); Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.First book to present complete, state-of-the-art coverage of dynamic fault memory testing Presents content using a "bottom-up" approach, from the electrical causes of malfunction up to the generation of smart test strategies Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.) Includes Spice simulation files and an SRAM logic fault simulator Includes supplementary material: sn.pub/extras
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