1995, ISBN: 079233504X
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1995, ISBN: 9780792335047
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1995, ISBN: 079233504X
[EAN: 9780792335047], Neubuch, [PU: Springer Netherlands Mai 1995], BIOCHEMIE; CHEMIE / ELEKTROTECHNIK; ORGANISCHE CHEMIE; AES; LASER; PAS; REM; STEM; STM; SENSOR, This item is printed on… Plus…
1995, ISBN: 9780792335047
Springer, Gebundene Ausgabe, Auflage: 1995, 264 Seiten, Publiziert: 1995-05-31T00:00:01Z, Produktgruppe: Buch, 2.69 kg, Hardware & Technik, Computer & Internet, Kategorien, Bücher, Maschi… Plus…
1995
ISBN: 079233504X
1995 Gebundene Ausgabe Biochemie, Chemie / Biochemie, Elektrotechnik, Organische Chemie, Materialwissenschaft, AES; Laser; PAS; REM; Stem; STM; Sensor, Protège-cahier 11, [PU:Springer N… Plus…
1995, ISBN: 9780792335047
Buch, Hardcover, 1995 ed. [PU: Springer], Springer, 1995
ISBN: 9780792335047
hardback, [PU: Kluwer Academic Publishers]
Données bibliographiques du meilleur livre correspondant
Auteur: | |
Titre: | |
ISBN: |
Informations détaillées sur le livre - Ultimate Limits of Fabrication and Measurement (NATO Science Series E:, 292, Band 292)
EAN (ISBN-13): 9780792335047
ISBN (ISBN-10): 079233504X
Version reliée
Date de parution: 1995
Editeur: Welland, M.E. Gimzewski, J.K. Springer
268 Pages
Poids: 0,567 kg
Langue: eng/Englisch
Livre dans la base de données depuis 2007-10-13T08:49:06+02:00 (Paris)
Page de détail modifiée en dernier sur 2023-08-11T16:21:22+02:00 (Paris)
ISBN/EAN: 9780792335047
ISBN - Autres types d'écriture:
0-7923-3504-X, 978-0-7923-3504-7
Autres types d'écriture et termes associés:
Titre du livre: workshop 1994, ultimate limits fabrication measurement, ultimate closed, zero limits
Données de l'éditeur
Auteur: M.E. Welland; J.K. Gimzewski
Titre: NATO Science Series E:; Ultimate Limits of Fabrication and Measurement
Editeur: Springer; Springer Netherland
254 Pages
Date de parution: 1995-05-31
Dordrecht; NL
Poids: 1,220 kg
Langue: Anglais
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
POD
X, 254 p.
BB; Condensed Matter Physics; Hardcover, Softcover / Physik, Astronomie/Atomphysik, Kernphysik; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); Verstehen; AES; Laser; PAS; REM; STEM; STM; Sensor; Organic Chemistry; Electrical Engineering; Biochemistry, general; Surfaces and Interfaces, Thin Films; Condensed Matter Physics; Organic Chemistry; Electrical and Electronic Engineering; Biochemistry; Surfaces, Interfaces and Thin Film; Organische Chemie; Elektrotechnik; Biochemie; Materialwissenschaft; BC; EA
Preface. Towards Molecular and Supramolecular Devices; J. A. Preece, J. F. Stoddart. Nanoscale Fabrication; W. M. Tolles. Microminiaturization in Laser Surgery and in vivo Intradiscal Pressure Measurements in Intervertebral Discs; H. S. Ranu. Self Replicating Systems and Low Cost Manufacturing; R. C. Merkle. The Use of Actuation Principles for Micro Robots; U. Rembold, S. Fatikow, Th. Dörsam, B. Magnussen. Biophysical Approach to Nanometre Engineering's Limits; E. Wallich. IDEAS - Intelligent Design Environment for Algorithms and Systems; T. Beth, J. Müller-Quade, A. Nückel. Electron-Nucleus Interaction in a Finite Atomic Line Modulated by a Focused Electric Field; C. Joachim, J. K. Heully, M. Devel, C. Girard. Electromagnetic Radiation in Nanostructures; J. B. Pendry. Using Atom Optics to Fabricate Nanostructures; R. J. Celotta, J. J. McClelland, R. E. Scholten, R. Gupta. Limits to Squeezing of Quantum Fluctuations; A. Orlowski. Micromechanical Calorimeter with pico-Joule Sensitivity; E. Meyer, J. K. Gimzewski, Ch. Gerber, R. R. Schlittler. The Point-Contact Thermometer and its Application in the Study of Hydrodynamic Electron Flow; L. W. Molenkamp, M. J. M. de Jong. Noise in Scanning Tunnelling Microscopy; B. Koslowski, C. Baur, K. Dransfield. A Nanosensor for Admittance Spectroscopy; L. Montelius, J. O. Tegenfeldt, T. G. I. Ling. Nanodeformation - Solid or Liquid? J. B. Pethica. Theory of Conduction through Quantum Necks; J. A. Torres, J. J. Sáenz. A Scanning Force and Friction Microscope; Ph. Niedermann, J. Burger, M. Binggeli, R. Christoph, H. E. Hintermann, O. Marti. Electrical Properties of Nanometer-Sized Metal-Semiconductor Point Contacts; Y. Hasegawa, I.-W. Lyo,Ph. Avouris. Study of Contact in the Fabrication of Gold Nanostructures by Scanning Tunnelling Microscopy; A. M. Baró, J. Gómez-Herrero, J. I. Pascual, J. Méndez, N. García. Fabrication of Nanoscale Gold Contacts with the STM: Possible Applications; C. van Haesendonck, L. Stockman, G. Neuttiens, Y. Bruynseraede. Suppression of Electron Tunnelling through Liquid Crystal Molecules due to Infrared Irradiation; H. Nejoh, V. A. Tkachenko, M. Tsukada, M. Aono: Influence of Thickness Fluctuations on Exchange Coupling in Fe/Cr/Fe Structures; J. A. Stroscio, D. T. Pierce, J. Unguris, R. J. Celotta. 1→3 Dimensional Structures on a Uni-Directional Substrate; P. W. Murray, F. M. Leibsle, C. A. Muryn, H. J. Fischer, C. F. J. Flipse, G. Thornton, J. K. Gimzewski, R. R. Schlittler. S-Layers as Molecular Patterning Structures; D. Pum, M. Sara, U. B. Sleytr. Formation of Sub-Micrometer Structures in Soft Functionalized Langmuir&endash;Blodgett Films by Atomic Force Microscopy; N. B. Larsen, T. Bjørnholm, J. Garnaes, J. Larsen, K. Schaumberg. Individual Molecules on GaAs(001)-(2×4) and Si(001)-(2×1): Images, Statistics, and Modelling; C. M. Goringe, A. R. Avery, A. J. Mayne, M. O. Schweitzer, W. Widdra, A. J. Fischer, T. S. Jones, G. A. D. Briggs, W. H. Weinberg, C. W. Smith. Extended Abstracts of Invited Papers: Molecular Manufacturing; K. E. Drexler. Self-Assembly: Whither and Thither Molecular Machines; J. A. Preece, J. F. Stoddart. Nanostructured Sensors for Molecular Recognition; W. Göpel. Micromechanisms; H. Guckel. Limits to Mechanical Positioning and Displacement; E. C. Teague. Is Quantum Mechanics Useful? R. LProceedings of the NATO Advanced Research Workshop, Cambridge, U.K., April 1--3, 1994
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