- 5 Résultats
prix le plus bas: € 16,99, prix le plus élevé: € 99,50, prix moyen: € 61,57
1
Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz & James M. Howe
Commander
sur Orellfuessli.ch
CHF 100,90
(environ € 99,50)
Envoi: € 17,751
CommanderLien sponsorisé
Brent Fultz & James M. Howe:

Transmission Electron Microscopy and Diffractometry of Materials - nouveau livre

ISBN: 9783642297618

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Plus…

Nr. A1031608643. Frais d'envoiLieferzeiten außerhalb der Schweiz 3 bis 21 Werktage, , Sofort per Download lieferbar, zzgl. Versandkosten. (EUR 17.75)
2
Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz#James M. Howe
Commander
sur Thalia.de
€ 96,29
Envoi: € 0,001
CommanderLien sponsorisé

Brent Fultz#James M. Howe:

Transmission Electron Microscopy and Diffractometry of Materials - nouveau livre

2012, ISBN: 9783642297618

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Plus…

Nr. 33784366. Frais d'envoi, Sofort per Download lieferbar, DE. (EUR 0.00)
3
Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James Howe
Commander
sur Springer.com
€ 78,10
Envoi: € 0,001
CommanderLien sponsorisé
Brent Fultz; James Howe:
Transmission Electron Microscopy and Diffractometry of Materials - nouveau livre

ISBN: 9783642297618

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds impo… Plus…

new in stock. Frais d'envoizzgl. Versandkosten. (EUR 0.00)
4
Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James Howe
Commander
sur lehmanns.de
€ 16,99
Envoi: € 0,001
CommanderLien sponsorisé
Brent Fultz; James Howe:
Transmission Electron Microscopy and Diffractometry of Materials - nouveau livre

2013, ISBN: 9783642297618

eBooks, eBook Download (PDF), Auflage, [PU: Springer Lehrbuch], [ED: 4], Springer Lehrbuch, 2013

Frais d'envoiDownload sofort lieferbar. (EUR 0.00)
5
Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James M. Howe
Commander
sur lehmanns.de
€ 16,99
Envoi: € 0,001
CommanderLien sponsorisé
Brent Fultz; James M. Howe:
Transmission Electron Microscopy and Diffractometry of Materials - nouveau livre

2013, ISBN: 9783642297618

eBooks, eBook Download (PDF), 4th ed. 2013, [PU: Springer Berlin], Springer Berlin, 2013

Frais d'envoiDownload sofort lieferbar. (EUR 0.00)

1Comme certaines plateformes ne transmettent pas les conditions d'expédition et que celles-ci peuvent dépendre du pays de livraison, du prix d'achat, du poids et de la taille de l'article, d'une éventuelle adhésion de la plateforme, d'une livraison directe par la plateforme ou via un prestataire tiers (Marketplace), etc. il est possible que les frais de livraison indiqués par eurolivre ne correspondent pas à ceux de la plateforme qui propose l'article.

Données bibliographiques du meilleur livre correspondant

Détails sur le livre

Informations détaillées sur le livre - Transmission Electron Microscopy and Diffractometry of Materials


EAN (ISBN-13): 9783642297618
ISBN (ISBN-10): 3642297617
Date de parution: 2012
Editeur: Springer Lehrbuch
761 Pages
Langue: eng/Englisch

Livre dans la base de données depuis 2012-11-07T08:35:01+01:00 (Paris)
Page de détail modifiée en dernier sur 2023-01-10T23:14:26+01:00 (Paris)
ISBN/EAN: 9783642297618

ISBN - Autres types d'écriture:
3-642-29761-7, 978-3-642-29761-8
Autres types d'écriture et termes associés:
Auteur du livre: james, howe, jam, brent, fultz
Titre du livre: electron microscopy materials, material, electro, transmission


Données de l'éditeur

Auteur: Brent Fultz; James Howe
Titre: Graduate Texts in Physics; Transmission Electron Microscopy and Diffractometry of Materials
Editeur: Springer; Springer Berlin
764 Pages
Date de parution: 2012-10-13
Berlin; Heidelberg; DE
Langue: Anglais
85,59 € (DE)
88,00 € (AT)
94,50 CHF (CH)
Available
XX, 764 p.

EA; E107; eBook; Nonbooks, PBS / Chemie/Physikalische Chemie; Spektroskopie, Spektrochemie, Massenspektrometrie; Verstehen; Characterization of Materials; Dark-Field and Bright-Field Imaging; Diffraction and Imaging; Diffraction from Crystals; Imaging Lens Systems; Neutron Scattering; Small-Angle Scattering; Theory of Electron Microscopy and X-Ray Diffraction; Transmission Electron Microscopy; X-Ray Diffractometry; B; Spectroscopy; Characterization and Analytical Technique; Surfaces, Interfaces and Thin Film; Surface and Interface and Thin Film; Physics and Astronomy; Werkstoffprüfung; Materialwissenschaft; Physik der kondensierten Materie (Flüssigkeits- und Festkörperphysik); BC

Diffraction and X-Ray Powder Diffractometer Problems.- TEM and its Optics Problems.- Neutron Scattering Problems.- Scattering Problems.- Inelastic Electron Scattering and Spectroscopy Problems.- Diffraction from Crystals Sphere Problems.- Electron Diffraction and Crystallography Problems.- Diffraction Contrast in TEM Images Problems.- Diffraction Lineshapes Problems.- Patterson Functions and Diffuse Scattering Problems.- High-Resolution TEM Imaging Problems.- High-Resolution STEM and Related Imaging Techniques Problems.- Dynamical Theory Problems.

Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials.

 

James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials.


New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learning and teaching with numerous problems at the end of each chapter to give students practice with the concepts and practical applications Explains the mathematics needed consistently through the book Helps to extend knowledge by indicating further reading Explains concepts in detail, with no requirement for different reference materials Includes supplementary material: sn.pub/extras

< pour archiver...