ISBN: 9781489906724
Coatings and Thin Films: Accurate Structural Characterization of ZrN Coatings and Epitaxial GaAs Layers by X Ray Diffraction Using the DOSOPHATEX System (R.Y. Fillitt et al.). Woo… Plus…
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ISBN: 9781489906724
Coatings and Thin Films: Accurate Structural Characterization of ZrN Coatings and Epitaxial GaAs Layers by X Ray Diffraction Using the DOSOPHATEX System (R.Y. Fillitt et al.). Woo… Plus…
Bussière, J. F. Green, Robert E. Ruud, C. O.:
Nondestructive Characterization of Materials IV - Première édition2013, ISBN: 9781489906724
Livres de poche
[ED: Kartoniert / Broschiert], [PU: Springer US], Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. There is a great deal of interest in ext… Plus…
2013
ISBN: 148990672X
Softcover reprint of the original 1st ed. 1991 Kartoniert / Broschiert alloy; ceramics; crystal; diffraction; modeling; Polymer; Ultrasound, mit Schutzumschlag 11, [PU:Springer US; Spri… Plus…
2013, ISBN: 9781489906724
Buch, Softcover, Softcover reprint of the original 1st ed. 1991, [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2013
2013, ISBN: 9781489906724
Buch, Softcover, Softcover reprint of the original 1st ed. 1991, [PU: Springer-Verlag New York Inc.], Springer-Verlag New York Inc., 2013
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Informations détaillées sur le livre - Nondestructive Characterization of Materials IV
EAN (ISBN-13): 9781489906724
ISBN (ISBN-10): 148990672X
Livre de poche
Date de parution: 2013
Editeur: Springer-Verlag New York Inc.
Livre dans la base de données depuis 2014-05-04T21:22:24+02:00 (Paris)
Page de détail modifiée en dernier sur 2022-12-09T00:03:14+01:00 (Paris)
ISBN/EAN: 9781489906724
ISBN - Autres types d'écriture:
1-4899-0672-X, 978-1-4899-0672-4
Autres types d'écriture et termes associés:
Auteur du livre: bussi, buss, robert green, eberhard fritz
Titre du livre: characterization materials
Données de l'éditeur
Auteur: J.F. Bussière; Robert E. Green; C.O. Ruud
Titre: Nondestructive Characterization of Materials IV
Editeur: Springer; Springer US
516 Pages
Date de parution: 2013-06-19
New York; NY; US
Imprimé / Fabriqué en
Poids: 0,807 kg
Langue: Anglais
213,99 € (DE)
219,99 € (AT)
236,00 CHF (CH)
POD
XII, 516 p.
BC; Characterization and Evaluation of Materials; Hardcover, Softcover / Technik/Maschinenbau, Fertigungstechnik; Werkstoffprüfung; Verstehen; alloy; ceramics; crystal; diffraction; modeling; polymer; ultrasound; Characterization and Analytical Technique; BB
Coatings and Thin Films: Accurate Structural Characterization of ZrN Coatings and Epitaxial GaAs Layers by X Ray Diffraction Using the DOSOPHATEX System (R.Y. Fillitt et al.). Wood, Paper, Concrete, and Ceramics: Nondestructive Evaluation of WoodPast, Present, and Future (R.F. Pellerin et al.0. Polymer, Composite Processing and Process Modeling: Sensor Development and Process COntrol in the Field of Polymer Compounding (H.G> Fritz et al.). Material Characterization and Modeling: In Process Characterization of Gallium Arsenide Crystals by XRay Digital Radiography and Computed Tomagraphy (J.W. Eberhard et al.). Microstructure and Plastic Deformation of Metals: Coercivity Measurement from Analysis of the Tangential Magnetic Field (G. Fillion et al.). Composites: Feature Based Studies on Guided Ultrasonic Wave Modes for Anomaly Estimation in Composite Structures (K. Balasubramaniam et al.). Residual Stresses and Fracture Mechanisms: An Ultrasonic Technique for the Identification of Crack Susceptible Microstructures in NickelCopper Alloy K500 Forgings (M.E. Natishan et al.). Texture and Property Anisotropy: Crystallographic Texture Analysis as a New Method for Material Characterization (J.R. Hirsch). 52 additional articles. Index.Autres livres qui pourraient ressembler au livre recherché:
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