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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - Trent McConaghy & Kristopher Breen & Jeffrey Dyck & Amit Gupta
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Trent McConaghy & Kristopher Breen & Jeffrey Dyck & Amit Gupta:

Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - edition reliée, livre de poche

ISBN: 9781461422686

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Plus…

Nr. A1019418990. Frais d'envoiLieferzeiten außerhalb der Schweiz 3 bis 21 Werktage, , Versandfertig innert 6 - 9 Werktagen, zzgl. Versandkosten. (EUR 17.51)
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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - nouveau livre

ISBN: 9781461422686

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Plus…

Nr. 978-1-4614-2268-6. Frais d'envoiWorldwide free shipping, , DE. (EUR 0.00)
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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - nouveau livre

ISBN: 9781461422686

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations… Plus…

Nr. 9781461422686. Frais d'envoi, , zzgl. Versandkosten., Livraison non-comprise
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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - McConaghy, Trent; Gupta, Amit; Dyck, Jeffrey; Breen, Kristopher
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McConaghy, Trent; Gupta, Amit; Dyck, Jeffrey; Breen, Kristopher:
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - edition reliée, livre de poche

2012, ISBN: 146142268X

2013 Gebundene Ausgabe Elektronik, CustomIntegratedCircuits; IntegratedCircuits; ResilientVLSICircuits; Statisticalprocessvariations; Variation-AwareCAD; Variation-awareIntegratedCircui… Plus…

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Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - Trent McConaghy
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Trent McConaghy:
Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide - edition reliée, livre de poche

ISBN: 9781461422686

Hardback, [PU: Springer-Verlag New York Inc.], This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm an… Plus…

Frais d'envoiVersandkostenfrei. (EUR 0.00)
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Variation-aware Design Of Custom Integrated Circuits: A Hands-on Field Guide
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ISBN:

9781461422686


This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  It teaches them the state-of-the-art in Variation-Aware Design tools, which help the designer to analyze quickly the variation effects, identify the problems, and fix the problems. Furthermore, this book describes the algorithms and algorithm behavior/performance/limitations, which is of use to designers considering these tools, designers using these tools, CAD researchers, and CAD managers.

Informations détaillées sur le livre - Variation-aware Design Of Custom Integrated Circuits: A Hands-on Field Guide


EAN (ISBN-13): 9781461422686
ISBN (ISBN-10): 146142268X
Version reliée
Date de parution: 2013
Editeur: Springer-Verlag New York Inc.
204 Pages
Poids: 0,473 kg
Langue: Englisch

Livre dans la base de données depuis 2008-12-01T04:10:29+01:00 (Paris)
Page de détail modifiée en dernier sur 2024-03-02T12:30:12+01:00 (Paris)
ISBN/EAN: 9781461422686

ISBN - Autres types d'écriture:
1-4614-2268-X, 978-1-4614-2268-6
Autres types d'écriture et termes associés:
Auteur du livre: dyck, kristopher, kristo, gupta, james hogan
Titre du livre: field guide, hand, trent, few hands, variation, integrated circuits

Données de l'éditeur

Auteur: Trent McConaghy; Kristopher Breen; Jeffrey Dyck; Amit Gupta
Titre: Variation-Aware Design of Custom Integrated Circuits: A Hands-on Field Guide
Editeur: Springer; Springer US
188 Pages
Date de parution: 2012-09-28
New York; NY; US
Imprimé / Fabriqué en
Poids: 4,321 kg
Langue: Anglais
139,09 € (DE)
142,99 € (AT)
153,50 CHF (CH)
POD
XVI, 188 p.

BB; Circuits and Systems; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Custom Integrated Circuits; Integrated Circuits; Resilient VLSI Circuits; Statistical process variations; Variation-Aware CAD; Variation-Aware Integrated Circuit Design; Variation-Tolerant Integrated Circuit Design; Electronics and Microelectronics, Instrumentation; Nanotechnology and Microengineering; Electronic Circuits and Systems; Electronics and Microelectronics, Instrumentation; Microsystems and MEMS; Elektronik; BC; EA

This book targets custom IC designers who are encountering variation issues in their designs, especially for modern process nodes at 45nm and below, such as statistical process variations, environmental variations, and layout effects.  The authors have created a field guide to show how to handle variation proactively, and to understand the benefits of doing so. Readers facing variation challenges in their memory, standard cell, analog/RF, and custom digital designs will find easy-to-read, pragmatic solutions.  Reviews the most important concepts in variation-aware design, including types of variables and variation, useful variation-aware design terminology, and an overview and comparison of high-level design flows.Describes and compares a suite of approaches and flows for PVT corner-driven design and verification. Presents Fast PVT, a novel, confidence-driven global optimization technique for PVT corner extraction and verification that is both rapid and reliable.Presents a visually-oriented overview of probability density functions, Monte Carlo sampling, and yield estimation.Describes a suite of methods used for 2-3 sigma statistical design and presents a novel sigma-driven corners flow, which is a fast, accurate, and scalable method suitable for 2-3 sigma design and verification.Describes and compares high-sigma design and verification techniques and presents a novel technique for high-sigma statistical corner extraction and verification, demonstrating its fast, accurate, scalable, and verifiable qualities across a variety of applications.Compares manual design and automated sizing and introduces an integrated approach to aid the sizing step in PVT, 3σ statistical and high-sigma statistical design.
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