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Advanced Test Methods for SRAMs - Arnaud Virazel#Serge Pravossoudovitch#Patrick Girard#Luigi Dilillo#Alberto Bosio
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Arnaud Virazel#Serge Pravossoudovitch#Patrick Girard#Luigi Dilillo#Alberto Bosio:

Advanced Test Methods for SRAMs - nouveau livre

ISBN: 9781441909374

ID: 41b375445bb9bc7cf91c8a3e95fbc091

Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here. Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book. Bücher / Fremdsprachige Bücher / Englische Bücher 978-1-4419-0937-4, Springer

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Advanced Test Methods for SRAMs - Alberto Bosio#Luigi Dilillo#Patrick Girard#Serge Pravossoudovitch#Arnaud Virazel
Livre non disponible
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Alberto Bosio#Luigi Dilillo#Patrick Girard#Serge Pravossoudovitch#Arnaud Virazel:

Advanced Test Methods for SRAMs - nouveau livre

ISBN: 9781441909374

ID: 41b375445bb9bc7cf91c8a3e95fbc091

Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here. Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book. Bücher / Fremdsprachige Bücher / Englische Bücher 978-1-4419-0937-4, Springer

Nouveaux livres Buch.ch
Nr. 17593585 Frais d'envoiBei Bestellungen innerhalb der Schweiz berechnen wir Fr. 3.50 Portokosten, Bestellungen ab EUR Fr. 75.00 sind frei. Die voraussichtliche Versanddauer liegt bei 1 bis 2 Werktagen., Versandfertig innert 3 - 5 Werktagen, zzgl. Versandkosten, Livraison non-comprise
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(*) Livre non disponible signifie que le livre est actuellement pas disponible à l'une des plates-formes associées nous recherche.
Advanced Test Methods for SRAMs - Alberto Bosio#Luigi Dilillo#Patrick Girard#Serge Pravossoudovitch#Arnaud Virazel
Livre non disponible
(*)
Alberto Bosio#Luigi Dilillo#Patrick Girard#Serge Pravossoudovitch#Arnaud Virazel:
Advanced Test Methods for SRAMs - nouveau livre

ISBN: 9781441909374

ID: 138218055

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called ´´static faults,´´ but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as ´´dynamic faults´´, are not covered by classical test solutions and require the dedicated test sequences presented in this book. Valuable testing and diagnostic methods for the latest generation of static random access memory (SRAM), are presented in this comprehensive guide. New fault models are required for the latest very deep sub-micron (VDSM) technologies, and are outlined here. Buch (fremdspr.) Bücher>Fremdsprachige Bücher>Englische Bücher, Springer

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Test Methods for SRAMs - Luigi Dilillo
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Luigi Dilillo:
Test Methods for SRAMs - nouveau livre

ISBN: 9781441909374

ID: 871640461

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called ''static faults,'' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as ''dynamic faults'', are not covered by classical test solutions and require the dedicated test sequences presented in this book. weltbild.at > Bücher > Wissenschaft & Technik > Fachbücher Technik, [PU: Springer]

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Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
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Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud:
Advanced Test Methods for SRAMs Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies - edition reliée, livre de poche

2009, ISBN: 1441909370

ID: A7126760

Gebundene Ausgabe Elektronik / Halbleiter, Halbleiter, Leitung (physikalisch) / Halbleiter, mit Schutzumschlag neu, [PU:Springer-Verlag GmbH]

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Détails sur le livre
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Auteur:

Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud

Titre:

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

ISBN:

9781441909374

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book. TOC:Introduction.-Basics on SRAM Memory Testing.-Resistive-Open Defects in Core-Cells.-Open Defects in Pre-Charge Circuits.-Resistive-Open Defects in Address Decoders.-Resistive-Open Defects in Write Drivers.-Resistive-Open Defects in Sense Amplifiers.-Faults due to Process Variations in SRAMs.-Diagnosis of Dynamic Faults.-Conclusion.

Informations détaillées sur le livre - Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies


EAN (ISBN-13): 9781441909374
ISBN (ISBN-10): 1441909370
Version reliée
Date de parution: 2009
Editeur: Springer-Verlag GmbH
171 Pages
Poids: 0,431 kg
Langue: eng/Englisch

Livre dans la base de données depuis 16.07.2007 19:12:18
Livre trouvé récemment le 01.12.2016 02:58:43
ISBN/EAN: 9781441909374

ISBN - Autres types d'écriture:
1-4419-0937-0, 978-1-4419-0937-4

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