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Yield and Variability Optimization of Integrated Circuits - Jian Cheng Zhang, Styblinski, M.A.
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Jian Cheng Zhang, Styblinski, M.A.:

Yield and Variability Optimization of Integrated Circuits - edition reliée, livre de poche

1995, ISBN: 9780792395515

Springer, Hardcover, Auflage: 1995, 251 Seiten, Publiziert: 1995-02-28T00:00:01Z, Produktgruppe: Book, 1.2 kg, Special Features, Books, Industrial Design, Decorative Arts & Design, Arts &… Plus…

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Jian Cheng Zhang:

Yield and Variability Optimization of Integrated Circuits - edition reliée, livre de poche

1995, ISBN: 0792395514

[EAN: 9780792395515], D'occasion, bon état, [SC: 68.17], [PU: Springer 1995-02-28], Item is in like new condition with minor shelf wear. Might have a remainder mark or slight wear from si… Plus…

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Yield and Variability Optimization of Integrated Circuits - Styblinski, M. A.; Jian Cheng Zhang
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Styblinski, M. A.; Jian Cheng Zhang:
Yield and Variability Optimization of Integrated Circuits - edition reliée, livre de poche

1995

ISBN: 0792395514

1995 Gebundene Ausgabe Elektrotechnik, Circuit; integratedcircuit; Material; modeling; performancetuning, mit Schutzumschlag 11, [PU:Springer US; Springer US, New York, N.Y.]

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Jian Cheng Zhang; Styblinski, M.A.:
Yield and Variability Optimization of Integrated Circuits - edition reliée, livre de poche

1995, ISBN: 0792395514

[EAN: 9780792395515], Nouveau livre, [SC: 39.99], [PU: Springer], New. In shrink wrap., Books

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Jian Cheng Zhang, M.A. Styblinski:
Yield and Variability Optimization of Integrated Circuits - edition reliée, livre de poche

1995, ISBN: 0792395514

[EAN: 9780792395515], New book, [PU: Springer], Clean and crisp and new!, Books

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Détails sur le livre
Yield and Variability Optimization of Integrated Circuits

Yield and Variability Optimization of Integrated Circuits deals with the primary and theoretical and practical aspects of IC statistical design and covers the most important issues of IC statistical design and the relevant mathematical framework. It describes a spectrum of different statistical circuit design problems, such as parametric yield optimization, generalized on-target design, variability minimization, performance tuning, and worst-case design. It also covers such topics as device statistical and worst-case modeling, design of experiments and factor screening, together with some basic tenets of fuzzy set theory and multi-objective statistical optimization. Several practical examples are used to familiarize the reader with the concepts, and demonstrate the applicability of various statistical circuit design methodologies. Yield and Variability Optimization of Integrated Circuits is intended as introductory reference material for various groups of IC designers, and the methodologies described provide an understanding of the complex problems of statistical circuit design, thus helping to enhance the overall quality of the ICs delivered to the customers.

Informations détaillées sur le livre - Yield and Variability Optimization of Integrated Circuits


EAN (ISBN-13): 9780792395515
ISBN (ISBN-10): 0792395514
Version reliée
Date de parution: 2007
Editeur: Springer
256 Pages
Poids: 0,555 kg
Langue: eng/Englisch

Livre dans la base de données depuis 2007-10-18T12:12:37+02:00 (Paris)
Page de détail modifiée en dernier sur 2023-10-23T14:20:35+02:00 (Paris)
ISBN/EAN: 9780792395515

ISBN - Autres types d'écriture:
0-7923-9551-4, 978-0-7923-9551-5
Autres types d'écriture et termes associés:
Auteur du livre: cheng, jian, zhang
Titre du livre: yield variability optimization integrated circuits, zhang jian


Données de l'éditeur

Auteur: Jian Cheng Zhang; M.A. Styblinski
Titre: Yield and Variability Optimization of Integrated Circuits
Editeur: Springer; Springer US
234 Pages
Date de parution: 1995-02-28
New York; NY; US
Langue: Anglais
106,99 € (DE)
109,99 € (AT)
118,00 CHF (CH)
Available
XVII, 234 p.

BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; circuit; integrated circuit; material; modeling; performance tuning; Electronic Circuits and Systems; Electrical and Electronic Engineering; Elektrotechnik; BC

1 Introduction.- 1.1 Design for Quality and Manufacturability.- 1.2 Notation.- 1.3 Interpretation of Basic Concepts.- 1.4 Summary.- 2 Overview of IC Statistical Modeling.- 2.1 Introduction.- 2.2 Process Variations.- 2.3 Environmental Variations.- 2.4 Statistical Macromodeling.- 2.5 Summary.- 3 Design of Experiments.- 3.1 Introduction.- 3.2 Experiment Analysis.- 3.3 Orthogonal Arrays.- 3.4 Main Effect Analysis.- 3.5 Interaction Analysis.- 3.6 Taguchi Experiments.- 3.7 Summary.- 4 Parametric Yield Maximization.- 4.1 Introduction.- 4.2 Yield Estimation.- 4.3 Indirect Yield Improvement.- 4.4 Direct Yield Optimization Methods.- 4.5 Generalized and Orthogonal Array-Based Gradient Methods for Discrete Circuits.- 4.6 Gradient Methods for Integrated Circuits.- 4.7 Examples.- 4.8 Summary.- 5 Variability Minimization and Tuning.- 5.1 Introduction.- 5.2 Principles of Discrete Circuit Variability Minimization.- 5.3 Principles of IC Variability Minimization.- 5.4 Factor Screening.- 5.5 Taguchi’s on-target Design.- 5.6 Two-Stage Design Strategy.- 5.7 Example 4: CMOS Delay Circuit.- 5.8 Example 5: CMOS Clock Driver.- 5.9 Summary.- 6 Worst-Case Measure Reduction.- 6.1 Introduction.- 6.2 The ±? Transistor Modeling.- 6.3 Worst-Case Measure Minimization.- 6.4 Comments on the ±? Model.- 6.5 Creation of Worst-Case Models From the Statistical Model.- 6.6 Summary.- 7 Multi-Objective Circuit Optimization.- 7.1 Introduction.- 7.2 Multiple-Objective Optimization: An Overview.- 7.3 Fuzzy Sets.- 7.4 Multiple-Performance Statistical Optimization.- 7.5 Multiple-Performance Variability Minimization.- 7.6 Summary.- References.

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