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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz
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Brent Fultz:

Transmission Electron Microscopy and Diffractometry of Materials - nouveau livre

ISBN: 9783642297618

ID: 9783642297618

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. Transmission Electron Microscopy and Diffractometry of Materials: This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. Characterization of Materials Dark-Field and Bright-Field Imaging Diffraction and Imaging Diffraction from Crystals Imaging Lens Systems Neutron Scattering Small-Angle Scattering Theory of Electron Microscopy and X-Ray Diffraction Transmission Ele, Springer Berlin

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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz
Livre non disponible
(*)

Brent Fultz:

Transmission Electron Microscopy and Diffractometry of Materials - nouveau livre

ISBN: 9783642297618

ID: 9783642297618

This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis. Transmission Electron Microscopy and Diffractometry of Materials: This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis. Characterization of Materials Dark-Field and Bright-Field Imaging Diffraction and Imaging Diffraction from Crystals Imaging Lens Systems Neutron Scattering Small-Angle Scattering Theory of Electron Microscopy and X-Ray Diffraction Transmission Ele, Springer Berlin

Nouveaux livres Rheinberg-Buch.de
Ebook, Englisch, Neuware Frais d'envoiAb 20¤ Versandkostenfrei in Deutschland, Sofort lieferbar, DE. (EUR 0.00)
Details...
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Transmission Electron Microscopy and Diffractometry of Materials - Fultz, Brent; Howe, James
Livre non disponible
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Fultz, Brent; Howe, James:
Transmission Electron Microscopy and Diffractometry of Materials - nouveau livre

2012

ISBN: 3642297617

ID: 9783642297618

In englischer Sprache. Verlag: Springer Berlin, Brent Fultz is a Professor of Materials Science and Applied Physics at California Institute of Technology, Pasadena. He is the successful co-author of a book on  Transmission Electron Microscopy and Diffractometry of Materials. James Howe is a Professor of Materials Science and Engineering at the University of Virginia, Charlottesville. He successfully co-authored the book Transmission Electron Microscopy and Diffractometry of Materials. PC-PDF, 761 Seiten, XX Seiten, 761 Seiten, 4., th ed. 2013, [GR: 9642 - Nonbooks, PBS / Physik, Astronomie/Mechanik, Akustik], [SW: - Klassische Mechanik ], [Ausgabe: 4], [PU: Springer, Berlin/Heidelberg/New York, NY]

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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James M. Howe
Livre non disponible
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Brent Fultz; James M. Howe:
Transmission Electron Microscopy and Diffractometry of Materials - nouveau livre

2013, ISBN: 9783642297618

ID: 25431058

[ED: 4], 4., th ed. 2013, eBook Download (PDF), eBooks, [PU: Springer Berlin]

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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James M. Howe
Livre non disponible
(*)
Brent Fultz; James M. Howe:
Transmission Electron Microscopy and Diffractometry of Materials - nouveau livre

2013, ISBN: 9783642297618

ID: 25431058

[ED: 4], 4th ed. 2013, eBook Download (PDF), eBooks, [PU: Springer Berlin]

Nouveaux livres Lehmanns.de
Frais d'envoiDownload sofort lieferbar, , Sin costos de envío dentro de Alemania (EUR 0.00)
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Détails sur le livre
Transmission Electron Microscopy and Diffractometry of Materials
Auteur:

Brent Fultz;James Howe

Titre:

Transmission Electron Microscopy and Diffractometry of Materials

ISBN:

3642297617

Informations détaillées sur le livre - Transmission Electron Microscopy and Diffractometry of Materials


EAN (ISBN-13): 9783642297618
ISBN (ISBN-10): 3642297617
Date de parution: 2012
Editeur: Springer Berlin
761 Pages
Langue: eng/Englisch

Livre dans la base de données depuis 07.11.2012 08:35:01
Livre trouvé récemment le 20.09.2016 01:12:58
ISBN/EAN: 3642297617

ISBN - Autres types d'écriture:
3-642-29761-7, 978-3-642-29761-8

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