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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz
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Brent Fultz:

Transmission Electron Microscopy and Diffractometry of Materials - nouveau livre

2012, ISBN: 9783642297601

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises., [SC: 1.50], Neuware, gewerbliches Angebot, 245x165x51 mm, [GW: 1334g]

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Transmission Electron Microscopy and Diffractometry of Materials, By Fultz, 4th Edition - Brent Fultz / James Howe
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Brent Fultz / James Howe:

Transmission Electron Microscopy and Diffractometry of Materials, By Fultz, 4th Edition - edition reliée, livre de poche

2013, ISBN: 9783642297601

ID: 13726050140

Hard cover, Hardcover. SKU: 9783642297601-1-0-3 Orders ship the same or next business day. Expedited shipping within U.S. will arrive in 3-5 days. Hassle free 14 day return policy. Contact Customer Service for questions. ISBN: 9783642297601., Neubuch, [PU: Springer]

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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz
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Brent Fultz:
Transmission Electron Microscopy and Diffractometry of Materials - edition reliée, livre de poche

ISBN: 9783642297601

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Transmission Electron Microscopy and Diffractometry of Materials Transmission-Electron-Microscopy-and-Diffractometry-of-Materials~~Brent-Fultz Science/Tech>Chemistry>Chemistry Hardcover, Springer Berlin Heidelberg

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Transmission Electron Microscopy and Diffractometry of Materials - Fultz, Brent, and Howe, James
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Fultz, Brent, and Howe, James:
Transmission Electron Microscopy and Diffractometry of Materials - edition reliée, livre de poche

2012, ISBN: 9783642297601

ID: 13671662604

Hard cover, Good., Sewn binding. Cloth over boards. 764 p. Contains: Illustrations, black & white. Graduate Texts in Physics., [PU: Springer]

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Transmission Electron Microscopy and Diffractometry of Materials - Brent Fultz; James M. Howe
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Brent Fultz; James M. Howe:
Transmission Electron Microscopy and Diffractometry of Materials - edition reliée, livre de poche

2012, ISBN: 9783642297601

ID: 23149317

[ED: 4], 4th ed. 2013, Hardcover, Buch, [PU: Springer Berlin]

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Détails sur le livre
Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)
Auteur:

Brent Fultz, James Howe

Titre:

Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)

ISBN:

3642297609

This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Informations détaillées sur le livre - Transmission Electron Microscopy and Diffractometry of Materials (Graduate Texts in Physics)


EAN (ISBN-13): 9783642297601
ISBN (ISBN-10): 3642297609
Version reliée
Date de parution: 2012
Editeur: Springer-Verlag GmbH
761 Pages
Poids: 1,318 kg
Langue: Englisch

Livre dans la base de données depuis 07.04.2009 22:49:51
Livre trouvé récemment le 16.12.2016 08:34:34
ISBN/EAN: 3642297609

ISBN - Autres types d'écriture:
3-642-29760-9, 978-3-642-29760-1

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