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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard
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Patrick Girard:

Power-Aware Testing and Test Strategies for Low Power Devices - nouveau livre

2001, ISBN: 9781441909275

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… Plus…

Frais d'envoiEnvío gratis. (EUR 0.00) Buchhandlung Kühn GmbH
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Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - Girard, Patrick
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Girard, Patrick:

Power-Aware Testing and Test Strategies for Low Power Devices / Patrick Girard (u. a.) / Buch / Englisch / 2009 - edition reliée, livre de poche

2009, ISBN: 9781441909275

[ED: Gebunden], [PU: Springer US], Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate … Plus…

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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard#Nicola Nicolici#Xiaoqing Wen
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Power-Aware Testing and Test Strategies for Low Power Devices - edition reliée, livre de poche

2009

ISBN: 9781441909275

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such a… Plus…

Nr. 17593546. Frais d'envoi, Sofort lieferbar, DE. (EUR 0.00)
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Power-Aware Testing and Test Strategies for Low Power Devices - Patrick Girard
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Patrick Girard:
Power-Aware Testing and Test Strategies for Low Power Devices - nouveau livre

2001, ISBN: 9781441909275

[ED: Buch], [PU: Springer-Verlag GmbH], Neuware - Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor indus… Plus…

Frais d'envoiEnvío gratis. (EUR 0.00) buchversandmimpf2000
5
Power-Aware Testing and Test Strategies for Low Power Devices - Girard, Patrick, Nicola Nicolici  und Xiaoqing Wen
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Girard, Patrick, Nicola Nicolici und Xiaoqing Wen:
Power-Aware Testing and Test Strategies for Low Power Devices - Première édition

2009, ISBN: 9781441909275

[PU: Springer US], Neubindung, Buchschnitt leicht verkürzt, Buchrücken leicht geknickt, 1. Auflage 2010 5664520/12, DE, [SC: 0.00], gebraucht; sehr gut, gewerbliches Angebot, 2010, Banküb… Plus…

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Détails sur le livre
Power-Aware Testing and Test Strategies for Low Power Devices

Managing the power consumption of circuits and systems is now considered one of the most important challenges for the semiconductor industry. Elaborate power management strategies, such as dynamic voltage scaling, clock gating or power gating techniques, are used today to control the power dissipation during functional operation. The usage of these strategies has various implications on manufacturing test, and power-aware test is therefore increasingly becoming a major consideration during design-for-test and test preparation for low power devices. This book explores existing solutions for power-aware test and design-for-test of conventional circuits and systems, and surveys test strategies and EDA solutions for testing low power devices.

Informations détaillées sur le livre - Power-Aware Testing and Test Strategies for Low Power Devices


EAN (ISBN-13): 9781441909275
ISBN (ISBN-10): 1441909273
Version reliée
Date de parution: 2009
Editeur: Springer-Verlag New York Inc.
363 Pages
Poids: 0,717 kg
Langue: eng/Englisch

Livre dans la base de données depuis 2009-11-13T20:04:16+01:00 (Paris)
Page de détail modifiée en dernier sur 2023-11-10T17:15:21+01:00 (Paris)
ISBN/EAN: 1441909273

ISBN - Autres types d'écriture:
1-4419-0927-3, 978-1-4419-0927-5
Autres types d'écriture et termes associés:
Auteur du livre: girard patrick, xiaoqi
Titre du livre: test, the power now


Données de l'éditeur

Auteur: Patrick Girard; Nicola Nicolici; Xiaoqing Wen
Titre: Power-Aware Testing and Test Strategies for Low Power Devices
Editeur: Springer; Springer US
363 Pages
Date de parution: 2009-11-23
New York; NY; US
Imprimé / Fabriqué en
Langue: Anglais
160,49 € (DE)
164,99 € (AT)
177,00 CHF (CH)
POD
XXI, 363 p.

BB; Hardcover, Softcover / Technik/Elektronik, Elektrotechnik, Nachrichtentechnik; Schaltkreise und Komponenten (Bauteile); Verstehen; Electronic Testing; Low Power Design; Low Power Testing; Nanoscale Testing; Nicolici; Power Aware Testing; Semiconductor Testing; VLSI; Wen; power management; semiconductor; testing; Electronic Circuits and Systems; Computer-Aided Engineering (CAD, CAE) and Design; Computer-Aided Design (CAD); EA; BC

Fundamentals of VLSI Testing.- Power Issues During Test.- Low-Power Test Pattern Generation.- Power-Aware Design-for-Test.- Power-Aware Test Data Compression and BIST.- Power-Aware System-Level Test Planning.- Low-Power Design Techniques and Test Implications.- Test Strategies for Multivoltage Designs.- Test Strategies for Gated Clock Designs.- Test of Power Management Structures.- EDA Solution for Power-Aware Design-for-Test.
Is the only comprehensive book on power-aware test for (low power) circuits and systems Instructs readers how low-power devices can be tested safely without affecting yield and reliability Includes necessary background information on design for test and low-power design Incorporates detailed coverage of all levels of abstraction for power-aware testing of (low-power) circuits and systems Presents state-of-the-art industrial practices and EDA solutions Includes supplementary material: sn.pub/extras

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